Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Biljana M. Gaković
Dimitri Batani
F. Canova
Milan S. Trtica
Edouard Krousky
Marco Bussoli
Marziale Milani
T. Desai

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Publication date

March 2007

DOI

10.1017/s0263034607070139

Language

English

Abstract

We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 μm. The interpretation of FIB images shows the high potentiality of the technique

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Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Abstract

Extracted data

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Abstract

Extracted data

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