The usage of static random access memory-based field programmable gate arrays (FPGAs) on high-energy physics detectors is mostly limited by the sensitivity of devices to radiation-induced upsets in their configuration. In this paper, we describe a scrubber core designed for Xilinx FPGAs, based on configuration redundancy. When no upsets happen in homologous redundant bits and the scrubber is functional, the adopted redundancy makes it possible to correct all the errors. In fact, the scrubber corrects its own configuration and the one pertaining to a given user design. We discuss the architecture and two implementations of the scrubber, corresponding to different flavors of triple modular redundancy. We report results from proton irradiation...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology...
Static RAM-based field programmable gate arrays (SRAM-based FPGAs) are widely adopted in t...
SRAM-based FPGAs are in-field reconfigurable an unlimited number of times. This characteristic, toge...
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly li...
Field Programmable Gate Arrays (FPGA) are used in a variety of applications, ranging from consumer e...
SRAM-based FPGAs are sensitive to radiation effects. Soft errors can appear and accumulate, potentia...
On-detector digital electronics in high-energy physics (HEP) experiments is increasingly being imple...
This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
This study establishes the optimal Single Event Upset (SEU) mitigation strategy for Xilinx's 7-Serie...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology...
Static RAM-based field programmable gate arrays (SRAM-based FPGAs) are widely adopted in t...
SRAM-based FPGAs are in-field reconfigurable an unlimited number of times. This characteristic, toge...
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly li...
Field Programmable Gate Arrays (FPGA) are used in a variety of applications, ranging from consumer e...
SRAM-based FPGAs are sensitive to radiation effects. Soft errors can appear and accumulate, potentia...
On-detector digital electronics in high-energy physics (HEP) experiments is increasingly being imple...
This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
This study establishes the optimal Single Event Upset (SEU) mitigation strategy for Xilinx's 7-Serie...
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology...