The reliability of the solder joints connecting microelectronic components to printed circuit boards (PCBs) is a serious concern in the design of many electronic devices. The focus of the present research was the fracture performance of component-solder-PCB assemblies with and without underfill adhesives under bending loading conditions. Fracture tests of copperâ solderâ copper double-cantilever-beam (DCB) specimens with a single continuous solder layer showed that for joints shorter than a characteristic length the fracture load increased with increasing solder joint length. Also, the fracture tests of DCBs with two discrete solder joints showed the strength was maximum at an optimal joint spacing. An analytical solution was developed fo...
Ball Grid Arrays (BGAs) are one of the dominant technologies for high-end packaging solutions of ele...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The effects of underfills on the thermal cycling test of lead-free (SnAgCu) PBGA packages on ImAg (i...
Double cantilever beam (DCB) specimens with distinct intermetallic microstructures and different geo...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
This paper reports how the solder joint fatigue lives of three types of lead free plastic BGA compon...
It has been established that it is the peripheral solder joints that are the most vulnerable in the ...
The critical strain energy release rate at crack initiation, Jci, has been shown to govern the fract...
This paper will examine the effects of the introduction of a periodic boundary condition and the pre...
The dependency of the failure mechanisms of PCB/BGA assemblies subjected to drop impact on board des...
With the recent development of mobile consumer electronics, a unique set of reliability issues those...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
The subject of the thesis work is to study the solder joint strength for BGA packages after differen...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
Ball Grid Arrays (BGAs) are one of the dominant technologies for high-end packaging solutions of ele...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The effects of underfills on the thermal cycling test of lead-free (SnAgCu) PBGA packages on ImAg (i...
Double cantilever beam (DCB) specimens with distinct intermetallic microstructures and different geo...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
This paper reports how the solder joint fatigue lives of three types of lead free plastic BGA compon...
It has been established that it is the peripheral solder joints that are the most vulnerable in the ...
The critical strain energy release rate at crack initiation, Jci, has been shown to govern the fract...
This paper will examine the effects of the introduction of a periodic boundary condition and the pre...
The dependency of the failure mechanisms of PCB/BGA assemblies subjected to drop impact on board des...
With the recent development of mobile consumer electronics, a unique set of reliability issues those...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
The subject of the thesis work is to study the solder joint strength for BGA packages after differen...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
Ball Grid Arrays (BGAs) are one of the dominant technologies for high-end packaging solutions of ele...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The effects of underfills on the thermal cycling test of lead-free (SnAgCu) PBGA packages on ImAg (i...