Double cantilever beam (DCB) specimens with distinct intermetallic microstructures and different geometries were fractured under different mode ratios of loading, ψ, to obtain critical strain energy release rate, Jc. The strain energy release rate at crack initiation, Jci, increased with phase angle, ψ, but remained unaffected by the joint geometry. However, the steady-state energy release rate, Jcs, increased with the solder layer thickness. Also, both the Jci and Jcs decreased with the thickness of the intermetallic compound layer. Next, mode I and mixed-mode fracture tests were performed on discrete (l=2 mm and l=5 mm) solder joints arranged in a linear array between two copper bars to evaluate the J = Jci (ψ) failure criteria using ...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
The trend towards miniaturization of electronic products leads to the need for very small sized sold...
The critical strain energy release rate at crack initiation, Jci, has been shown to govern the fract...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
The reliability of the solder joints connecting microelectronic components to printed circuit boards...
Conventional assessment of solder joint reliability uses either ball shear test or solder ball pull ...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
Solder joints are a common sight in electronic packaging which serves as mechanical and electrica...
Thesis (Ph.D.), School of Mechanical and Materials Engineering, Washington State UniversityDuring se...
The main goal of this paper is to shed light on the effect of strain rate and viscoplastic deformati...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fr...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
The trend towards miniaturization of electronic products leads to the need for very small sized sold...
The critical strain energy release rate at crack initiation, Jci, has been shown to govern the fract...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
The reliability of the solder joints connecting microelectronic components to printed circuit boards...
Conventional assessment of solder joint reliability uses either ball shear test or solder ball pull ...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
Solder joints are a common sight in electronic packaging which serves as mechanical and electrica...
Thesis (Ph.D.), School of Mechanical and Materials Engineering, Washington State UniversityDuring se...
The main goal of this paper is to shed light on the effect of strain rate and viscoplastic deformati...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fr...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
The trend towards miniaturization of electronic products leads to the need for very small sized sold...