Inheritance pattern of earliness and yield traits in half diallel crosses of spring wheat

Half diallel mating system was used to evaluate six wheat cultivars and their F1 and F2 populations for inheritance of earliness, morphological and yield traits. These genotypes were crossed in a half diallel fashion during 2010-11 to get 15 cross combinations. The 6 Ă 6 wheat F1 and F2 half diallel populations and their parental cultivars were assessed through randomized complete block (RCB) design during 2011-12 and 2012-13, respectively. Genotypes revealed significant (pâ ¤0.01) differences for all the traits in both generations. According to scaling tests, additive-dominance model was partially adequate for all the traits in F1 and F2 generations. Diallel analysis revealed significant values for additive (D) and dominance (H1, H2) genetic components of variance for majority traits in both generations, however, over dominance type of gene action was predominant for inheritance. Additive gene action was observed for days to heading and plant height in F1, tiller per plant and grain yield per plant in F2 generation. In the loci (H2The accepted manuscript in pdf format is listed with the files at the bottom of this page. The presentation of the authors' names and (or) special characters in the title of the manuscript may differ slightly between what is listed on this page and what is listed in the pdf file of the accepted manuscript; that in the pdf file of the accepted manuscript is what was submitted by the author