A development of multiple external reflection infrared spectroscopy

In infrared spectroscopy the RAS (Reflection Absorption Spectroscopy) method has ever been used for investigating metal surfaces, while the MIR-IRAS (Infrared spectroscopy in Multiple Internal Reflection geometry) method has been used for investigating semiconductor surface. A new method for investigating metal surfaces, which uses the optical system for MIR-IRAS, is developed in order to improve the sensitivity of the RAS method. The sensitivity is estimated and the possibility of this method is discussed