IODP Expedition 362 Scanning electron microscope images
- McNeill, L.C.
- Dugan, B.
- Petronotis, K.E.
- Backman, J.
- Bourlange, S.
- Chemale, F.
- Chen, W.
- Colson, T.A.
- Frederik, M.C.G.
- Guèrin, G.
- Hamahashi, M.
- Henstock, T.
- House, B.M.
- Hüpers, A.
- Jeppson, T.N.
- Kachovich, S.
- Kenigsberg, A.R.
- Kuranaga, M.
- Kutterolf, S.
- Milliken, K.L.
- Mitchison, F.L.
- Mukoyoshi, H.
- Nair, N.
- Owari, S.
- Pickering, K.T.
- Pouderoux, H.F.A.
- Shan, Y.
- Song, I.
- Torres, M.E.
- Vannucchi, P.
- Vrolijk, P.J.
- Yang, T.
- Zhao, X.
Publication date
March 2020
DOIAbstract
Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken
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