Sample: Data is taken of a iPP/EO (DOW ENGAGETM 8540) blend interface. The blend was cryo-microtomed to a nominal slice thickness of 50nm. Transmission electron microscopy was performed using the TEAM I microscope at the Lawrence Berkeley National Laboratory using a Gatan K3 detector and Continuum spectrometer. Data Set 12: This work was performed at -185°C under liquid nitrogen cooling with a 300kV accelerating voltage and a semi-convergence angle of 0.5mrad which yielded a diffraction-limited probe with a full-width half-max of 2nm. The beam was rastered with a step size of 5nm over a 505 × 500nm2 field of view. The electron dose per sample area over the entire scan is 20 e-/Å2. However, 4D-STEM is a converged probe technique in which ~8...
We have analyzed the nanoscale organization of various polymer systems by utilizing high-angle annul...
Many functional materials are difficult to analyze by Scanning Transmission Electron Microscopy (STE...
4D-STEM datasets from Ribet, S.M., Ophus, C., Reis, R.D. and Dravid, V.P "Defect contrast with 4D-ST...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Understanding and visualizing the heterogeneous structure of immiscible semicrystalline polymer syst...
Plunge-frozen grids containing crystals of proteinase K with approximate dimensions of 12 x 10 x 10 ...
This letter is meant to make scientists aware of the proper application of transmission electron mic...
The relationship between sample thickness and quality of data obtained is investigated by microcryst...
4D-STEM data frequently requires a number of calibrations in order to make accurate measurement: for...
ConspectusScanning electron nanobeam diffraction, or 4D-STEM (four-dimensional scanning transmission...
Synthetic colloidal nanoparticles are nowadays omnipresent. Nonetheless, adequately characterizing t...
In transmission electron microscopy (TEM) the interaction of an electron beam with polymers such as ...
The raw 4D-SCED and 4D-STEM (NBD) datasets in our paper: Seeing Structural Evolution of Organic Mol...
Cryotechniques must be employed throughout all preparation and observation steps in order to extract...
We have analyzed the nanoscale organization of various polymer systems by utilizing high-angle annul...
Many functional materials are difficult to analyze by Scanning Transmission Electron Microscopy (STE...
4D-STEM datasets from Ribet, S.M., Ophus, C., Reis, R.D. and Dravid, V.P "Defect contrast with 4D-ST...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Understanding and visualizing the heterogeneous structure of immiscible semicrystalline polymer syst...
Plunge-frozen grids containing crystals of proteinase K with approximate dimensions of 12 x 10 x 10 ...
This letter is meant to make scientists aware of the proper application of transmission electron mic...
The relationship between sample thickness and quality of data obtained is investigated by microcryst...
4D-STEM data frequently requires a number of calibrations in order to make accurate measurement: for...
ConspectusScanning electron nanobeam diffraction, or 4D-STEM (four-dimensional scanning transmission...
Synthetic colloidal nanoparticles are nowadays omnipresent. Nonetheless, adequately characterizing t...
In transmission electron microscopy (TEM) the interaction of an electron beam with polymers such as ...
The raw 4D-SCED and 4D-STEM (NBD) datasets in our paper: Seeing Structural Evolution of Organic Mol...
Cryotechniques must be employed throughout all preparation and observation steps in order to extract...
We have analyzed the nanoscale organization of various polymer systems by utilizing high-angle annul...
Many functional materials are difficult to analyze by Scanning Transmission Electron Microscopy (STE...
4D-STEM datasets from Ribet, S.M., Ophus, C., Reis, R.D. and Dravid, V.P "Defect contrast with 4D-ST...