Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Ryder, Kaitlyn
Wyrwas, Edward J.
Berg, Melanie D.
Wilcox, Edward P.
Topper, Alyson D.
Lauenstein, Jean-Marie
Ladbury, Ray L.
Casey, Megan C.
O'Bryan, Martha V.
Campola, Michael J.
Majewicz, Peter J.
Pellish, Jonathan A.
Stansberry, Scott D.
Cochran, Donna J.
LaBel, Kenneth A.

July 2019

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...

Characterization Of Esd Protection Devices Under Total Ionizing Dose Irradiation

Liang, Wei
Alexandrou, Kostas
Klebanov, Maxim
Kuo, Chung Chen
Kymissis, Ioannis

October 2017

In this paper, the total ionizing dose effects on electrostatic discharge (ESD) protection devices a...

Towards defining a simplified procedure for COTS system-on-chip TID testing

Di Mascio, S. (author)
Menicucci, A. (author)
Furano, Gianluca (author)
Szewczyk, Tomasz (author)
Campajola, Luigi (author)
Di Capua, Francesco (author)
Lucaroni, Andrea (author)
Ottavi, Marco (author)

January 2018

The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is an impo...

Total Ionizing Dose Effects in Bipolar and BiCMOS Devices

Rax, Bernard G.
Johnston, Allan H.
Scheick, Leif Z.
Chavez, Rosa M.
FROM

July 2005

This paper describes total ionizing dose (TID) test results performed at JPL. Bipolar and BiCMOS dev...

Total ionizing dose effects in bipolar and BiCMOS devices

Chavez, R. M.
Rax, B. G.
Scheick, L. Z.
Johnston, A. H.

August 2005

This paper describes total ionizing dose (TID) test results performed at JPL. Bipolar and BiCMOS dev...

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

Titus, J. L.
Emily, D.
Krieg, J. F.
Turflinger, T.
Pease, R. L.
Campbell, A.

January 1999

To investigate the ELDRS effect in a real space environment, an experiment was designed, launched, a...

Recent Radiation Test Results at JPL

B. E. Pritchard
B. G. Rax
S. S. Mcclure

October 2016

This paper documents recent TID test results (including proton damage and ELDRS) obtained by JPL. Un...

Total dose bias dependency and ELDRS effects in bipolar linear devices

Yui, C. C.
McClure, S. S.
Rax, B. G.
Lehman, J. M.
Minto, T. D.
Wiedeman, M. D.

February 2002

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias durin...

Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

Adell, Philippe C.
Barnaby, Hugh J.
McClure, Steven
Triggs, B.
Rax, Bernard
Kruckmeyer, Kirby
Pease, Ronald L.

July 2011

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitiv...

Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs

Sahu, Kusum
Sharma, Ashok K.

January 1998

This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Boutte, Alvin J.
Carts, Martin A.
Ladbury, Raymond L.
Sanders, Anthony B.
LaBel, Kenneth A.
Marshall, Cheryl J.
O'Bryan, Martha V.
Casey, Megan C.
Chen, Dakai
Xapsos, Michael A.
Lauenstein, Jean-Marie
Oldham, Timothy R.
Campola, Michael J.
Cochran, Donna J.
Pellish, Jonathan A.

July 2011

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

LaBel, Kenneth A.
Casey, Megan C.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
O'Bryan, Martha V.
Wilcox, Edward P.
Burton, Noah D.

July 2018

Total ionizing dose and displacement damage dose testing were performed to characterize and determin...

Investigations on MGy Total Ionizing Dose Effects in CMOSTechnologies

Gaillardin, M.
Paillet, Philippe
Goiffon, Vincent
Martinez, Martial
Girard, Sylvain
Raine, Melanie
Marcandella, Claude
Olivier, Duhamel
Magnan, Pierre

July 2015

International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

TOTAL IONIZING DOSE EFFECTS AND RADIATION TESTING

Boychenko, Dmitry
Kalashnikov, Oleg
Nikiforov, Aleksandr
Ulanova, Anastasija
Bobrovsky, Dmitry
Nekrasov, Pavel

December 2014

Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale in...

NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Ryder, Kaitlyn
Wyrwas, Edward J.
Berg, Melanie D.
Wilcox, Edward P.
Topper, Alyson D.
Lauenstein, Jean-Marie
Ladbury, Ray L.
Casey, Megan C.
O'Bryan, Martha V.
Campola, Michael J.
Majewicz, Peter J.
Pellish, Jonathan A.
Stansberry, Scott D.
Cochran, Donna J.
LaBel, Kenneth A.

July 2019

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...

Characterization Of Esd Protection Devices Under Total Ionizing Dose Irradiation

Liang, Wei
Alexandrou, Kostas
Klebanov, Maxim
Kuo, Chung Chen
Kymissis, Ioannis

October 2017

In this paper, the total ionizing dose effects on electrostatic discharge (ESD) protection devices a...

Towards defining a simplified procedure for COTS system-on-chip TID testing

Di Mascio, S. (author)
Menicucci, A. (author)
Furano, Gianluca (author)
Szewczyk, Tomasz (author)
Campajola, Luigi (author)
Di Capua, Francesco (author)
Lucaroni, Andrea (author)
Ottavi, Marco (author)

January 2018

The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is an impo...

Total Ionizing Dose Effects in Bipolar and BiCMOS Devices

Rax, Bernard G.
Johnston, Allan H.
Scheick, Leif Z.
Chavez, Rosa M.
FROM

July 2005

This paper describes total ionizing dose (TID) test results performed at JPL. Bipolar and BiCMOS dev...

Total ionizing dose effects in bipolar and BiCMOS devices

Chavez, R. M.
Rax, B. G.
Scheick, L. Z.
Johnston, A. H.

August 2005

This paper describes total ionizing dose (TID) test results performed at JPL. Bipolar and BiCMOS dev...

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

Titus, J. L.
Emily, D.
Krieg, J. F.
Turflinger, T.
Pease, R. L.
Campbell, A.

January 1999

To investigate the ELDRS effect in a real space environment, an experiment was designed, launched, a...

Recent Radiation Test Results at JPL

B. E. Pritchard
B. G. Rax
S. S. Mcclure

October 2016

This paper documents recent TID test results (including proton damage and ELDRS) obtained by JPL. Un...

Total dose bias dependency and ELDRS effects in bipolar linear devices

Yui, C. C.
McClure, S. S.
Rax, B. G.
Lehman, J. M.
Minto, T. D.
Wiedeman, M. D.

February 2002

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias durin...

Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

Adell, Philippe C.
Barnaby, Hugh J.
McClure, Steven
Triggs, B.
Rax, Bernard
Kruckmeyer, Kirby
Pease, Ronald L.

July 2011

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitiv...

Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs

Sahu, Kusum
Sharma, Ashok K.

January 1998

This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Boutte, Alvin J.
Carts, Martin A.
Ladbury, Raymond L.
Sanders, Anthony B.
LaBel, Kenneth A.
Marshall, Cheryl J.
O'Bryan, Martha V.
Casey, Megan C.
Chen, Dakai
Xapsos, Michael A.
Lauenstein, Jean-Marie
Oldham, Timothy R.
Campola, Michael J.
Cochran, Donna J.
Pellish, Jonathan A.

July 2011

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

LaBel, Kenneth A.
Casey, Megan C.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
O'Bryan, Martha V.
Wilcox, Edward P.
Burton, Noah D.

July 2018

Total ionizing dose and displacement damage dose testing were performed to characterize and determin...

Investigations on MGy Total Ionizing Dose Effects in CMOSTechnologies

Gaillardin, M.
Paillet, Philippe
Goiffon, Vincent
Martinez, Martial
Girard, Sylvain
Raine, Melanie
Marcandella, Claude
Olivier, Duhamel
Magnan, Pierre

July 2015

International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

TOTAL IONIZING DOSE EFFECTS AND RADIATION TESTING

Boychenko, Dmitry
Kalashnikov, Oleg
Nikiforov, Aleksandr
Ulanova, Anastasija
Bobrovsky, Dmitry
Nekrasov, Pavel

December 2014

Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale in...

NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Ryder, Kaitlyn
Wyrwas, Edward J.
Berg, Melanie D.
Wilcox, Edward P.
Topper, Alyson D.
Lauenstein, Jean-Marie
Ladbury, Ray L.
Casey, Megan C.
O'Bryan, Martha V.
Campola, Michael J.
Majewicz, Peter J.
Pellish, Jonathan A.
Stansberry, Scott D.
Cochran, Donna J.
LaBel, Kenneth A.

July 2019

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...

Characterization Of Esd Protection Devices Under Total Ionizing Dose Irradiation

Liang, Wei
Alexandrou, Kostas
Klebanov, Maxim
Kuo, Chung Chen
Kymissis, Ioannis

October 2017

In this paper, the total ionizing dose effects on electrostatic discharge (ESD) protection devices a...

Towards defining a simplified procedure for COTS system-on-chip TID testing

Di Mascio, S. (author)
Menicucci, A. (author)
Furano, Gianluca (author)
Szewczyk, Tomasz (author)
Campajola, Luigi (author)
Di Capua, Francesco (author)
Lucaroni, Andrea (author)
Ottavi, Marco (author)

January 2018

The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is an impo...

Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

Abstract

Extracted data

Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

Abstract

Extracted data

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