Synchrotron Diffraction Data Recorded during High Temperature Deformation of Ti-64

A caked synchrotron X-ray diffraction (SXRD) dataset, recording diffraction pattern rings during the high temperature deformation of a Ti-64 sample. The sample was deformed in uniaxial tension at 950°C and a strain rate of about 0.02 s-1, using an electro-thermal mechanical tester (ETMT) mounted on the I12:JEEP beamline at Diamond Light Source. Results were recorded using a high energy 89 keV synchrotron X-ray beam and a fast acquisition rate (10 Hz) detector. The results of this experiment are presented in the paper; C.S. Daniel, C.-T. Nguyen, M.D. Atkinson, J.Q. da Fonseca, Direct Evidence for Dynamic Phase Transformation during High Temperature Deformation in Ti-64, MATEC Web Conf. 321 (2020) 12037. 10.1051/matecconf/20203211203