Supplementary Information: Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

Jeffrey Ede
Jonathan J. P. Peters
Jeremy Sloan
Richard Beanland

Publication date

November 2020

DOI

Abstract

Supplementary information for our paper "Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning" (https://arxiv.org/abs/2001.10938)

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Supplementary Information: Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

Abstract

Extracted data

Supplementary Information: Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

Abstract

Extracted data

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