Input Data: These data files contain the spectral data, reflectance (R) and transmittance (T), and the film characteristics, thickness (d) and optical constants (n, k) for various materials. 'TrainTestData.npz' contains fully synthetic data, 'perovData.npz' contains semi-synthetic data, and 'ExpData.npz' contains experimentally measured data. Note that the file: 'Refractive_Index_Library' contains a wide range of references for different refractive index and extinction coefficient profiles. Also, 'Rcal-CGO.txt' and 'Tcal-CGO.txt' files contain spectral data for performance comparison with existing methods. Adopted Models: The optical dispersion models, ensembles of Tauc-Lorentz and Gaussian oscillators, are implemented in 'VensembleTL.py',...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...
The Reverse Engineering problem addressed in the present research consists in es-timating the thickn...
International audienceIn the present paper we determine the optical constants and thicknesses of mul...
My master's thesis deals with creating of a suitable evaluation technique that optimizes the optical...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
Inverse modelling of inherent optical properties (IOP) is an alternative to the in situ measurements...
We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matr...
According to the transmission mode of polarized light in Mueller ellipsometry, a characterization me...
The evaluation from experimental data, of physical quantities, which enter into the electromagnetic ...
The film thickness in experimental data are measured using combinations of the process variables (M,...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
Determination of the so-called optical constants (complex refractive index N, which is usually a fun...
The reverse engineering problem addressed in the present research consists of estimating the thickne...
We discuss a new method to estimate the absorption coefficient, the index of refraction, and the thi...
We present a procedure for the optical characterization of thin-film stacks from spectrophotometric ...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...
The Reverse Engineering problem addressed in the present research consists in es-timating the thickn...
International audienceIn the present paper we determine the optical constants and thicknesses of mul...
My master's thesis deals with creating of a suitable evaluation technique that optimizes the optical...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
Inverse modelling of inherent optical properties (IOP) is an alternative to the in situ measurements...
We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matr...
According to the transmission mode of polarized light in Mueller ellipsometry, a characterization me...
The evaluation from experimental data, of physical quantities, which enter into the electromagnetic ...
The film thickness in experimental data are measured using combinations of the process variables (M,...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
Determination of the so-called optical constants (complex refractive index N, which is usually a fun...
The reverse engineering problem addressed in the present research consists of estimating the thickne...
We discuss a new method to estimate the absorption coefficient, the index of refraction, and the thi...
We present a procedure for the optical characterization of thin-film stacks from spectrophotometric ...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...
The Reverse Engineering problem addressed in the present research consists in es-timating the thickn...
International audienceIn the present paper we determine the optical constants and thicknesses of mul...