ThinFilmsTools.jl provides tools for the design and characterisation of thin films written in Julia. More documentation, examples and details can be found in the Wiki page. The package includes modules for the calculation of parameters of thin films: TMMO1DIsotropic for the simulation of optical properties of thin films, FitTMMO1DIsotropic to fit thin films spectrum and ThreeOmegaMethod to model the thermal properties of thin films based on the 3ω method. The package also contains a number of indices of refraction for different materials in a database RefractiveIndicesDB.jl ready to use. For the simulation of index of refraction mixtures, there is also available a database RefractiveIndicesModels.jl that contains several mixing rules for...
Spectroscopic ellipsometry (SE) has proven to be a very powerful diagnostic for thin film characteri...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...
In the world of nanomaterials and meta-materials, thin films are used which are an order of magnitud...
How to make valid optical measurements, how to interpret the data, and how to simulate them with a s...
Module DescriptionDuring this module, created by the Center for Nanotechnology Education (Nano-Link...
Determination of the so-called optical constants (complex refractive index N, which is usually a fun...
Abstract: A computer simulation program for processing transmission spectra of amorphous optical th...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
Mathematical models for index of refraction versus wavelength such as Cauchy, Sellmeier, Drude etc.,...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
Achieving the desired optical response from a multilayer thin-film structure over a broad range of w...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
Visualization 1 showing Refraction from flat lens Originally published in JOSA A on 01 April 2016 (j...
Spectroscopic ellipsometry (SE) has proven to be a very powerful diagnostic for thin film characteri...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...
In the world of nanomaterials and meta-materials, thin films are used which are an order of magnitud...
How to make valid optical measurements, how to interpret the data, and how to simulate them with a s...
Module DescriptionDuring this module, created by the Center for Nanotechnology Education (Nano-Link...
Determination of the so-called optical constants (complex refractive index N, which is usually a fun...
Abstract: A computer simulation program for processing transmission spectra of amorphous optical th...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
Mathematical models for index of refraction versus wavelength such as Cauchy, Sellmeier, Drude etc.,...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
Achieving the desired optical response from a multilayer thin-film structure over a broad range of w...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
Visualization 1 showing Refraction from flat lens Originally published in JOSA A on 01 April 2016 (j...
Spectroscopic ellipsometry (SE) has proven to be a very powerful diagnostic for thin film characteri...
The optical behavior of devices based on thin films is determined by complex refractive index and th...
In recent papers, the problem of estimating the thickness and the optical constants (refractive inde...