Recent processors are shrinking in size due to the advancement of technology. Reliability is an important design parameter along with power, cost, and performance. The processors need to be fault tolerant to counter reliability challenges. This work proposes a dynamic thermal and voltage management (DTVM) system which ensures a reasonable level of fault tolerance. The fault tolerance system (FTS) identifies and subsequently can forecast temporary failures at run-time. The temporary failures are dynamically estimated on SoC FPGAs for a class of heterogeneous applications. The dynamic priority scheduling based on absolute deadline is adopted to improve the nature of FTS. Experimental results indicate that the failure rate reduces by 7.2% with...
AbstractTriple Modular Redundancy (TMR) is real time reliability known to improve computing systems....
In this paper we propose an automated design flow for the implementation of autonomous fault-toleran...
With the continuous downscaling of semiconductor processes, the growing power density and thermal is...
Arrays, have resulted in high on-chip power densities, and temperatures. The heterogeneity of compon...
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential f...
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential f...
Reliability failure mechanisms, such as time dependent dielectric e breakdown, electromigration, and...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
Dependability issues due to non functional properties are emerging as major cause of faults in moder...
System dependability being a set of number of attributes, of which the important reliability, heavil...
Radiation tolerance in FPGAs is an important field of research particularly for reliable computation...
The operation of FPGA systems, like most VLSI technology, is traditionally governed by static timing...
International audienceEmbedded systems in critical domains, such as automotive, aviation, space doma...
International audienceThis paper presents an approach for increasing the lifetime of systems impleme...
CMOS scaling has greatly increased concerns for both lifetime reliability due to permanent faults an...
AbstractTriple Modular Redundancy (TMR) is real time reliability known to improve computing systems....
In this paper we propose an automated design flow for the implementation of autonomous fault-toleran...
With the continuous downscaling of semiconductor processes, the growing power density and thermal is...
Arrays, have resulted in high on-chip power densities, and temperatures. The heterogeneity of compon...
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential f...
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential f...
Reliability failure mechanisms, such as time dependent dielectric e breakdown, electromigration, and...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
Dependability issues due to non functional properties are emerging as major cause of faults in moder...
System dependability being a set of number of attributes, of which the important reliability, heavil...
Radiation tolerance in FPGAs is an important field of research particularly for reliable computation...
The operation of FPGA systems, like most VLSI technology, is traditionally governed by static timing...
International audienceEmbedded systems in critical domains, such as automotive, aviation, space doma...
International audienceThis paper presents an approach for increasing the lifetime of systems impleme...
CMOS scaling has greatly increased concerns for both lifetime reliability due to permanent faults an...
AbstractTriple Modular Redundancy (TMR) is real time reliability known to improve computing systems....
In this paper we propose an automated design flow for the implementation of autonomous fault-toleran...
With the continuous downscaling of semiconductor processes, the growing power density and thermal is...