Exploring the synergies between electronic material measurements and modeling

Despite bilateral links, the two worlds of material measurements and computer modelling are mostly advanced by separate groups of researchers. In this talk, we report our works within the European H2020 MMAMA project, aiming to bring the two worlds closer together. We focus on the resonant methods of dielectric measurements and present new models (e.g. industrial CAD formats translated into conformal FDTD meshes) and simulation procedures (e.g. near-field-imaging) that support their understanding (of e.g. SPDR and SiPDR techniques) and developments (e.g. downscaling of surface scans). We discuss grid-search workflows that help illustrate sensitivities to material data