IODP Expedition 374 X-ray fluorescence (XRF)
- McKay, Robert M.
- De Santis, Laura
- Kulhanek, Denise K.
- Ash, Jeanine L.
- Beny, François
- Browne, Imogen M.
- Cordeiro de Sousa, Isabela M.
- Cortese, Giuseppe
- Dodd, Justin P.
- Esper, Oliver M.
- Gales, Jenny A.
- Harwood, David M.
- Ishino, Saki
- Keisling, Benjamin A.
- Kim, Sookwan
- Kim, Sunghan
- Laberg, Jan S.
- Leckie, R. M.
- Müller, Juliane
- Patterson, Molly O.
- Romans, Brian W.
- Romero, Oscar E.
- Sangiorgi, Francesca
- Seki, Osamu
- Shevenell, Amelia
- Singh, Shiv M.
- Sugisaki, Saiko T.
- van de Flierdt, Tina
- van Peer, Tim E.
- Xiao, Wenshen
- Xiong, Zhifang
Publication date
August 2019
DOIAbstract
Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions
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