Fault diagnosis in processing digital system application has raised various limiting problems. While basic objective of fault tolerant systems is to minimize the fault occurring in the device, the processing error is an additional error to be considered. Past approaches were observed to be focusing much on internal fault in digital device, the error due to processing and communication is to be developed. In this paper a self correcting approach to memory design based on memory interface is proposed. The error approach observed in case of forwarding binary data to encode, store and retrieve with error free coding is proposed. The Process of memory error free coding results in higher reliability in case of bit and block coding
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
Abstract—This paper proposes a simple and effective built-in self-repair (BISR) scheme for content a...
This paper examines how to design a low-cost and algorithm-based approach that recovers random multi...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Part I. Correction of Cell Defects in Integrated Memories: This paper introduces two schemes to corr...
The technology advancement scaling to Reliability,Availability and Serviceability are the three impo...
In this paper, we analyze the error behavior of content addressable memories and provide necessary a...
Inherently error-resilient applications in areas such as signal processing, machine learning and dat...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
[[abstract]]The objective of this paper is to present a cost-effective fault diagnosis methodology f...
The paper aims to propose as elementary work on a reliable memory system that can tolerate multiple ...
Targeting on the future fault-prone hybrid CMOS/Nanodevice digital memories, this paper present two ...
Special Issue on Defect and Fault ToleranceInternational audienceDrastic device shrinking, power sup...
[[abstract]]We present a memory built-in self-diagnosis (BISD) design that incorporates a fault synd...
In this paper an innovative fault tolerant solid state mass memory (FTSSMM) architecture is describe...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
Abstract—This paper proposes a simple and effective built-in self-repair (BISR) scheme for content a...
This paper examines how to design a low-cost and algorithm-based approach that recovers random multi...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Part I. Correction of Cell Defects in Integrated Memories: This paper introduces two schemes to corr...
The technology advancement scaling to Reliability,Availability and Serviceability are the three impo...
In this paper, we analyze the error behavior of content addressable memories and provide necessary a...
Inherently error-resilient applications in areas such as signal processing, machine learning and dat...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
[[abstract]]The objective of this paper is to present a cost-effective fault diagnosis methodology f...
The paper aims to propose as elementary work on a reliable memory system that can tolerate multiple ...
Targeting on the future fault-prone hybrid CMOS/Nanodevice digital memories, this paper present two ...
Special Issue on Defect and Fault ToleranceInternational audienceDrastic device shrinking, power sup...
[[abstract]]We present a memory built-in self-diagnosis (BISD) design that incorporates a fault synd...
In this paper an innovative fault tolerant solid state mass memory (FTSSMM) architecture is describe...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
Abstract—This paper proposes a simple and effective built-in self-repair (BISR) scheme for content a...
This paper examines how to design a low-cost and algorithm-based approach that recovers random multi...