Abstract: This paper proposes a method to accurately locate the source of product quality drift in a flexible manufacturing system (FMS). Based on the relationship between fault sources, a fault propagation mechanism in the production process is proposed to explain fault propagation after production. Logic diagnostic models are used to reduce the search space for suspicious equipment in the production process; however, this does not help to accurately locate the faulty equipment. In the proposed method, we model this reduced search space as a Bayesian network, which uses historical data to calculate the conditional probability of each suspicious device. This method helps to make accurate decisions to locate the cause of product quality drif...
A diagnostic method based on Bayesian Networks (probabilistic graphical models) is presented. Unlike...
This research develops a fault diagnosis method for complex systems in the presence of uncertainties...
[EN] This paper presents a modeling methodology, detection and isolation of faults on the operative ...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper proposes a test protocol for drift identification and classificatio...
This paper proposes a test protocol for drift identification and classification in a complex product...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceIn the literature, several fault diagnosis methods, qualitative as well quanti...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
In this work, a new approach for fault diagnosis in the field of additive manufacturing (3d printing...
A diagnostic method based on Bayesian Networks (probabilistic graphical models) is presented. Unlike...
This research develops a fault diagnosis method for complex systems in the presence of uncertainties...
[EN] This paper presents a modeling methodology, detection and isolation of faults on the operative ...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper proposes a test protocol for drift identification and classificatio...
This paper proposes a test protocol for drift identification and classification in a complex product...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceIn the literature, several fault diagnosis methods, qualitative as well quanti...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
In this work, a new approach for fault diagnosis in the field of additive manufacturing (3d printing...
A diagnostic method based on Bayesian Networks (probabilistic graphical models) is presented. Unlike...
This research develops a fault diagnosis method for complex systems in the presence of uncertainties...
[EN] This paper presents a modeling methodology, detection and isolation of faults on the operative ...