This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target IC. Being able to access JTAG using only one or two pins, this circuit does not change the original boundary scanning test frequency of target IC. Compared with the traditional JTAG interface which based on IEEE std. 1149.1, this reduced pin technology is more applicability in pin limited devices, and it is easier to control the scale of target IC for the designer
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...
Traditional test and measurement equipment that relies on connecting external probes is no longer p...
This master's thesis deals with designing and implementation of universal programmer with JTAG inter...
Boundary-Scan Architecture (JTAG) is widely used as a debug interface, providing a path for a debugg...
Abstract – Boundary-scan, formally known as IEEE 1149.1-2001, is a collection of design rules applie...
This study explores the possibilities for reducing the number of pins needed for scan mode interface...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
As the technology is shrinking and the working frequency is going into multi gigahertz range, the is...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
PCBs continue to become more complex each year with higher ball count BGA devices, larger memories a...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
The final cost of an integrated circuit (IC) is proportional to its testing time. One of the main go...
Empirical thesis.Bibliography: pages 99-102.1. Introduction -- 2. Background and related work -- 3. ...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
At present, the interface system in IC equipment control software system has to be changed even when...
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...
Traditional test and measurement equipment that relies on connecting external probes is no longer p...
This master's thesis deals with designing and implementation of universal programmer with JTAG inter...
Boundary-Scan Architecture (JTAG) is widely used as a debug interface, providing a path for a debugg...
Abstract – Boundary-scan, formally known as IEEE 1149.1-2001, is a collection of design rules applie...
This study explores the possibilities for reducing the number of pins needed for scan mode interface...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
As the technology is shrinking and the working frequency is going into multi gigahertz range, the is...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
PCBs continue to become more complex each year with higher ball count BGA devices, larger memories a...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
The final cost of an integrated circuit (IC) is proportional to its testing time. One of the main go...
Empirical thesis.Bibliography: pages 99-102.1. Introduction -- 2. Background and related work -- 3. ...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
At present, the interface system in IC equipment control software system has to be changed even when...
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...
Traditional test and measurement equipment that relies on connecting external probes is no longer p...
This master's thesis deals with designing and implementation of universal programmer with JTAG inter...