Electromagnetic Fault Injection (EMFI) is considered as an effective fault injection technique for the purpose of conducting physical attacks against integrated circuits. It enables an adversary to inject errors on a circuit to gain knowledge of sensitive information or to bypass security features. The aim of this paper is to highlight the design and validation of SiliconToaster, which is a cheap and programmable platform for EM pulse injection. It has been designed using low-cost and accessible components that can be easily found. In addition, it can inject faults with a programmable voltage up to 1.2kV without the need to an external power supply as it is powered by the USB. The second part of the paper invests the SiliconToaster in order...
International audienceImplementation attacks are a major threat to hardware cryptographic implementa...
10 pagesInternational audienceInjection of transient faults as a way to attack cryptographic impleme...
Fault attacks are traditionally considered under a threat model that assumes the device under test i...
Security is acknowledged as one of the main challenges in the design and deployment of embedded circ...
© 2017 IEEE. Security is acknowledged as one of the main challenges in the design and deployment of ...
Electromagnetic Fault Injection (EMFI) is a well-known technique for performing fault injection atta...
Voltage fault injection is a powerful active side channel attack that modifies the execution-flow of...
EMFI has become a popular fault injection (FI) technique due to its ability to inject faults precise...
International audienceA fault attack is a well-known technique where the behaviour of a chip is volu...
An analysis of the effectiveness of fault injection attacks on smart cards using the transient pulse...
Fault injection attack against embedded devices has attracted much attention in recent years. As a h...
This article considers the use of magnetic pulses to inject transient faults into the calculations o...
International audienceThis article describes the use of a near-field electromagnetic pulse EMP injec...
International audienceInjection of transient faults can be used as a way to attack embedded systems....
Physical attacks by injection of faults by electromagnetic perturbations have the particularity of i...
International audienceImplementation attacks are a major threat to hardware cryptographic implementa...
10 pagesInternational audienceInjection of transient faults as a way to attack cryptographic impleme...
Fault attacks are traditionally considered under a threat model that assumes the device under test i...
Security is acknowledged as one of the main challenges in the design and deployment of embedded circ...
© 2017 IEEE. Security is acknowledged as one of the main challenges in the design and deployment of ...
Electromagnetic Fault Injection (EMFI) is a well-known technique for performing fault injection atta...
Voltage fault injection is a powerful active side channel attack that modifies the execution-flow of...
EMFI has become a popular fault injection (FI) technique due to its ability to inject faults precise...
International audienceA fault attack is a well-known technique where the behaviour of a chip is volu...
An analysis of the effectiveness of fault injection attacks on smart cards using the transient pulse...
Fault injection attack against embedded devices has attracted much attention in recent years. As a h...
This article considers the use of magnetic pulses to inject transient faults into the calculations o...
International audienceThis article describes the use of a near-field electromagnetic pulse EMP injec...
International audienceInjection of transient faults can be used as a way to attack embedded systems....
Physical attacks by injection of faults by electromagnetic perturbations have the particularity of i...
International audienceImplementation attacks are a major threat to hardware cryptographic implementa...
10 pagesInternational audienceInjection of transient faults as a way to attack cryptographic impleme...
Fault attacks are traditionally considered under a threat model that assumes the device under test i...