Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing visually using a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size, shape or component skew). High false call rate is a fundamental concern of AOI machines that occurs when a component is considered as a ‘fail’ incorrectly that then have to be verified manually. In order to alleviate this problem, we train and compare different machine learning models (Decision Tree, Random Forest, K-Nearest Neighbors and Artificial Neural Network) and thresholds using logged fail data and extracting the efficient categorical and numerical features. The results show that ...
This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University Lo...
Ever growing PCB industry requires automation during manufacturing process to produce defect free pr...
In this paper, an evaluation of machine learning classifiers to be applied in wafer defect detection...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Ensuring the highest quality standards at competitive prices is one of the greatest challenges in th...
Nowadays, the rapidly changing of manufacturing environment has pushed companies to achieve more cus...
Under the emerging topic of machine vision technology replacing manual examination, automatic optica...
The increasing competition forces manufacturing companies striving for Zero Defect Manufacturing to ...
Automatic Optical Inspection (AOI) is any method of detecting defects during a Printed Circuit Board...
Abstract In the following, we present a synthetic benchmark corpus for detect detection on statisti...
Many automated optical inspection (AOI) companies use supervised object detection networks to inspec...
Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In...
This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University Lo...
Ever growing PCB industry requires automation during manufacturing process to produce defect free pr...
In this paper, an evaluation of machine learning classifiers to be applied in wafer defect detection...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Automated Optical Inspection (AOI) machines inspect the Printed Circuit Board (PCB) manufacturing vi...
Ensuring the highest quality standards at competitive prices is one of the greatest challenges in th...
Nowadays, the rapidly changing of manufacturing environment has pushed companies to achieve more cus...
Under the emerging topic of machine vision technology replacing manual examination, automatic optica...
The increasing competition forces manufacturing companies striving for Zero Defect Manufacturing to ...
Automatic Optical Inspection (AOI) is any method of detecting defects during a Printed Circuit Board...
Abstract In the following, we present a synthetic benchmark corpus for detect detection on statisti...
Many automated optical inspection (AOI) companies use supervised object detection networks to inspec...
Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In...
This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University Lo...
Ever growing PCB industry requires automation during manufacturing process to produce defect free pr...
In this paper, an evaluation of machine learning classifiers to be applied in wafer defect detection...