Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection

Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice

Holý, V.
Stangl, J.
Zerlauth, S.
Bauer, G.
Darowski, N.
Lübbert, D.
Pietsch, U.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice

Bauer, G.
Darowski, N.
Holy, V.
Lübbert, D.
Pietsch, U.
Zerlauth, S.
Stangl, J.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

High resolution x-ray diffraction and reflectivity studies of vertical and lateral ordering in multiple self-organized InGaAs quantum dots

Darhuber, A.A.
Holy, V.
Stangl, J.
Bauer, G.
Krost, A.
Heinrichsdorff, F.
Grundmann, M.
Bimberg, D.
Ustinov, V.M.
Kop'Ev, P.S.
Kosogov, A.O.
Werner, P.

January 1997

We have investigated multiple layers of self-assembled InGaAs quantum dots by high-resolution X-ray ...

Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection

Darhuber, A.A.
Holy, V.
Stangl, J.
Bauer, G.
Schittenhelm, P.
Abstreiter, G.
Prokes, S.M.

January 1997

Self-organized Ge-dots on (OOI)-oriented Si-substrates have been studied using twodimensionally reso...

High resolution x-ray diffraction from multilayered self-assembled Ge-dots

Darhuber, AA Anton
Schittenhelm, P
Holy, V
Stangl, Julian
Bauer, G
Abstreiter, G

January 1997

We have studied multilayers of self-assembled Ge-rich dots embedded in silicon grown by molecular-be...

X-ray diffraction and reflection from self-assembled Ge dots

Darhuber, A.A.
Stangl, J.
Bauer, G.
Schittenhelm, P.
Abstreiter, G.

January 1997

We have studied the structural properties of single and multiple layers of self-organised Ge islands...

Structural characterization of self-assembled Ge dots by x-ray diffraction and reflectivity methods

Darhuber, A.A.
Holy, V.
Schittenhelm, P.
Stangl, J.
Kegel, I.
Kovats, Z.
Metzger, T.H.
Bauer, G.
Abstreiter, G.
Grübel, G.

January 1998

We have studied the structural properties of multiple layers of self-assembled Ge dots non-destructi...

Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

Darhuber, A. A
Holy, V.
Schittenhelm, P.
Stangl, J.
Kegel, I.
Kovats, Z.
Metzger, T. H
Bauer, G.
Abstreiter, G.
Grübel, G.

January 1998

We have studied the structural properties of multiple layers of self-assembled Ge dots non-destructi...

Self-assembeld ge-dots : growth, characterization, ordering and applications

Schittenhelm, P.
Engel, C.
Findeis, F.
Abstreiter, G.
Darhuber, A.A.
Bauer, G.
Kosogov, A.O.
Werner, P.

January 1998

The Stranski–Krastanow growth mode, which leads to the self-assembled formation of dots, allows one ...

Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques

Darhuber, A.A.
Stangl, J.
Holy, V.
Bauer, G.
Krost, A.
Heinrichsdorff, F.
Grundmann, M.
Bimberg, D.
Ustinov, V.M.
Kop'Ev, P.S.
Kosogov, A.O.
Werner, P.

January 1997

We have investigated, by means of X-ray diffraction reciprocal space mapping and X-ray reflectivity,...

Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

Darhuber, A. A.
Stangl, J.
Werner, P.
Holy, V.
Bauer, G.
Krost, A.
Grundmann, M.
Bimberg, D.
Ustinov, V. M.
Kop'ev, P. S.
Kosogov, A. O.

January 1997

We have investigated, by means of X-ray diffraction reciprocal space mapping and X-ray reflectivity,...

Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice

Holý, V.
Stangl, J.
Zerlauth, S.
Bauer, G.
Darowski, N.
Lübbert, D.
Pietsch, U.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice

Bauer, G.
Darowski, N.
Holy, V.
Lübbert, D.
Pietsch, U.
Zerlauth, S.
Stangl, J.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

High resolution x-ray diffraction and reflectivity studies of vertical and lateral ordering in multiple self-organized InGaAs quantum dots

Darhuber, A.A.
Holy, V.
Stangl, J.
Bauer, G.
Krost, A.
Heinrichsdorff, F.
Grundmann, M.
Bimberg, D.
Ustinov, V.M.
Kop'Ev, P.S.
Kosogov, A.O.
Werner, P.

January 1997

We have investigated multiple layers of self-assembled InGaAs quantum dots by high-resolution X-ray ...

Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection

Darhuber, A.A.
Holy, V.
Stangl, J.
Bauer, G.
Schittenhelm, P.
Abstreiter, G.
Prokes, S.M.

January 1997

Self-organized Ge-dots on (OOI)-oriented Si-substrates have been studied using twodimensionally reso...

High resolution x-ray diffraction from multilayered self-assembled Ge-dots

Darhuber, AA Anton
Schittenhelm, P
Holy, V
Stangl, Julian
Bauer, G
Abstreiter, G

January 1997

We have studied multilayers of self-assembled Ge-rich dots embedded in silicon grown by molecular-be...

X-ray diffraction and reflection from self-assembled Ge dots

Darhuber, A.A.
Stangl, J.
Bauer, G.
Schittenhelm, P.
Abstreiter, G.

January 1997

We have studied the structural properties of single and multiple layers of self-organised Ge islands...

Structural characterization of self-assembled Ge dots by x-ray diffraction and reflectivity methods

Darhuber, A.A.
Holy, V.
Schittenhelm, P.
Stangl, J.
Kegel, I.
Kovats, Z.
Metzger, T.H.
Bauer, G.
Abstreiter, G.
Grübel, G.

January 1998

We have studied the structural properties of multiple layers of self-assembled Ge dots non-destructi...

Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

Darhuber, A. A
Holy, V.
Schittenhelm, P.
Stangl, J.
Kegel, I.
Kovats, Z.
Metzger, T. H
Bauer, G.
Abstreiter, G.
Grübel, G.

January 1998

We have studied the structural properties of multiple layers of self-assembled Ge dots non-destructi...

Self-assembeld ge-dots : growth, characterization, ordering and applications

Schittenhelm, P.
Engel, C.
Findeis, F.
Abstreiter, G.
Darhuber, A.A.
Bauer, G.
Kosogov, A.O.
Werner, P.

January 1998

The Stranski–Krastanow growth mode, which leads to the self-assembled formation of dots, allows one ...

Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques

Darhuber, A.A.
Stangl, J.
Holy, V.
Bauer, G.
Krost, A.
Heinrichsdorff, F.
Grundmann, M.
Bimberg, D.
Ustinov, V.M.
Kop'Ev, P.S.
Kosogov, A.O.
Werner, P.

January 1997

We have investigated, by means of X-ray diffraction reciprocal space mapping and X-ray reflectivity,...

Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

Darhuber, A. A.
Stangl, J.
Werner, P.
Holy, V.
Bauer, G.
Krost, A.
Grundmann, M.
Bimberg, D.
Ustinov, V. M.
Kop'ev, P. S.
Kosogov, A. O.

January 1997

We have investigated, by means of X-ray diffraction reciprocal space mapping and X-ray reflectivity,...

Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice

Holý, V.
Stangl, J.
Zerlauth, S.
Bauer, G.
Darowski, N.
Lübbert, D.
Pietsch, U.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice

Bauer, G.
Darowski, N.
Holy, V.
Lübbert, D.
Pietsch, U.
Zerlauth, S.
Stangl, J.

January 1999

Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated ...

High resolution x-ray diffraction and reflectivity studies of vertical and lateral ordering in multiple self-organized InGaAs quantum dots

Darhuber, A.A.
Holy, V.
Stangl, J.
Bauer, G.
Krost, A.
Heinrichsdorff, F.
Grundmann, M.
Bimberg, D.
Ustinov, V.M.
Kop'Ev, P.S.
Kosogov, A.O.
Werner, P.

January 1997

We have investigated multiple layers of self-assembled InGaAs quantum dots by high-resolution X-ray ...

Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection

Abstract

Extracted data

Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection

Abstract

Extracted data

Related items

Related items