This report concerns variable gain control (VGC), a specific class of nonlinear control. It is investigated if there exist disturbance situations where VGC utilizing a tri-modal nonlinearity leads to improved performance compared to VGC using the more common bi-modal nonlinearities. A model derived from a wafer stage of a wafer scanner is used for this investigation. The steady-state errors, resulting from a certain disturbance situation, are calculated using the MTF algorithm. The performance is quantified using the performance indicator J, which allows for emphasis on either the low-frequent or the high-frequent content present in this steady-state error. Two different tri-modal nonlinearities were constructed. In the first case, performa...