In this thesis, a Cross Sectional Scanning Tunneling Microscope (X-STM) is used to investigate nanostructures in IIIV semiconductors and single Mn impurities in bulk GaAs. The atomic resolution which can be achieved with X-STM makes it possible to link structural properties of nanostructures to growth conditions and to properties obtained in other experiments. Furthermore, X-STM is very well suited to investigate the effect of a quantum dot on single Mn acceptors both in terms of potential confinement and in terms of strain. In recent years, quantum dots have emerged as essential components of new generation optical devices. The use of Sb has proven to be a way of tuning the emission wavelength of quantum dots. X-STM measurements have been ...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is used to study Mn and Sb containing III-V se...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
This thesis deals with cross-sectional scanning tunneling microscopy analyses on III/V and II/VI sem...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
This thesis presents structural and morphological studies of semiconductor nanostructures, namely qu...
In recent years, nanostructure technology involving Ill-V semiconductors have made significant progr...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is used to study Mn and Sb containing III-V se...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is an ideal tool to study the structural prope...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
This thesis deals with cross-sectional scanning tunneling microscopy analyses on III/V and II/VI sem...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
Several growth procedures for doping InAs/GaAs quantum dots (QDs) with manganese (Mn) have been inve...
This thesis presents structural and morphological studies of semiconductor nanostructures, namely qu...
In recent years, nanostructure technology involving Ill-V semiconductors have made significant progr...
Cross-sectional Scanning Tunneling Microscopy (X-STM) is used to study Mn and Sb containing III-V se...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots usin...