The effort required for integration and testing of high-tech multi-disciplinary systems is increasing with each new or upgraded system that is developed. To counter this trend of increasing integration and test lead time and costs, we propose a model-based integration and testing (MBI&T) method, where formal and executable models of the system components are used to replace the component realizations for early integration and system testing. In this paper, we describe how the integration and testing process currently used in industry can be made more intelligent by applying model-based techniques from the MBI&T method. We also show how to analyze the necessary trade-off between the investments needed for model development and the po...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...
To reduce the integration and test effort for high-tech multi-disciplinary systems, we use formal an...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...
The effort required for integration and testing of high-tech multi-disciplinary systems is increasin...
AbstractNew methods and techniques are needed to reduce the very costly integration and test effort ...
New methods and techniques are needed to reduce the very costly integration and test effort (in term...
To reduce the integration and test effort for high-tech multi-disciplinary systems, we are developin...
For manufacturers of high-tech multi-disciplinary systems such as semiconductor equipment, the effor...
Industrial trends show that the lead time and costs of integrating and testing high-tech multi-disci...
Industrial trends show that the lead time and costs of integrating and testing high-tech multi-disci...
This paper describes three Ph.D. projects performed in the framework of the Tangram project [1], in ...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...
To reduce the integration and test effort for high-tech multi-disciplinary systems, we use formal an...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...
The effort required for integration and testing of high-tech multi-disciplinary systems is increasin...
AbstractNew methods and techniques are needed to reduce the very costly integration and test effort ...
New methods and techniques are needed to reduce the very costly integration and test effort (in term...
To reduce the integration and test effort for high-tech multi-disciplinary systems, we are developin...
For manufacturers of high-tech multi-disciplinary systems such as semiconductor equipment, the effor...
Industrial trends show that the lead time and costs of integrating and testing high-tech multi-disci...
Industrial trends show that the lead time and costs of integrating and testing high-tech multi-disci...
This paper describes three Ph.D. projects performed in the framework of the Tangram project [1], in ...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...
To reduce the integration and test effort for high-tech multi-disciplinary systems, we use formal an...
New methods and techniques are needed to reduce the integration and test effort (lead time, costs, r...