The influence of a lack of sufficient electrical conductivity on the results of quantitative electron probe microanalysis has been investigated on a number of oxides. The effect of surface charging and the way it alters the emitted X-ray signals has been studied. It is shown that the presence of conducting coatings, such as carbon or copper, will affect the interelement X-ray intensity ratios, whatever the thickness of the coating may be. Although the effects for heavier elements may be acceptable, they cannot be ignored for a light element such as oxygen, where strong variations with coating thickness were observed. Quantitative analyses of oxygen, on uncoated well-conducting oxide specimens, using uncoated well-conducting hematite (Fe2O3)...
This article describes about the nature of potential drops (PDs) on carbon steel (SS400) and stainle...
EPMA is frequently used to study the composition of high-temperature superconducting oxides. Typical...
International audienceA simple and fast method for thickness measurements using electron probe micro...
The influence of a lack of sufficient electrical conductivity on the results of quantitative electro...
Des couches minces de plus de 0,2 µm d'épaisseur sont déterminés par les méthodes établies pour l'ét...
Due to considerable improvements in electronic stability and detector sensitivity, modern electron m...
Electron probe microanalysis (EPMA) is a fairly mature analytical technique which has been widely us...
Electron probe microanalysis (WDS) is used to study oxide film thickness (1-1000 nm), oxide stoichio...
This paper discusses a generalized method to measure with the electron probe microanalyzer (EPMA) th...
The use of electron probe microanalysis (EPMA) at low voltage allows improvements in the lateral res...
Quantitative electron probe microanalysis of highly insulating materials is a complicated problem, p...
We studied the effective contact potential difference (ECPD) of thin film nanostructures and its rol...
Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field forma...
It has been determined that, in the normal range of aluminium coating thicknesses used to remove cha...
While the most familiar consequences of specimen charging in transmission electron microscopy can b...
This article describes about the nature of potential drops (PDs) on carbon steel (SS400) and stainle...
EPMA is frequently used to study the composition of high-temperature superconducting oxides. Typical...
International audienceA simple and fast method for thickness measurements using electron probe micro...
The influence of a lack of sufficient electrical conductivity on the results of quantitative electro...
Des couches minces de plus de 0,2 µm d'épaisseur sont déterminés par les méthodes établies pour l'ét...
Due to considerable improvements in electronic stability and detector sensitivity, modern electron m...
Electron probe microanalysis (EPMA) is a fairly mature analytical technique which has been widely us...
Electron probe microanalysis (WDS) is used to study oxide film thickness (1-1000 nm), oxide stoichio...
This paper discusses a generalized method to measure with the electron probe microanalyzer (EPMA) th...
The use of electron probe microanalysis (EPMA) at low voltage allows improvements in the lateral res...
Quantitative electron probe microanalysis of highly insulating materials is a complicated problem, p...
We studied the effective contact potential difference (ECPD) of thin film nanostructures and its rol...
Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field forma...
It has been determined that, in the normal range of aluminium coating thicknesses used to remove cha...
While the most familiar consequences of specimen charging in transmission electron microscopy can b...
This article describes about the nature of potential drops (PDs) on carbon steel (SS400) and stainle...
EPMA is frequently used to study the composition of high-temperature superconducting oxides. Typical...
International audienceA simple and fast method for thickness measurements using electron probe micro...