This paper presents an alternative modeling and simulation method for CMOS bridging faults. The significance of the method is the introduction of a set of generic-bridge tables which characterize the bridged outputs for each bridge and a set of generic-cell tables which characterize how each cell propagates a logically undefined input. These two sets of tables are derived dynamically for a specific design by using a SPICE circuit simulator. Then they can be used by any logic fault simulator to simulate bridging faults. In this way, the proposed method can perform very fast bridging fault simulation yet with SPICE accuracy. The paper shows how these two sets of tables are derived and used in a parallel pattern fault simulator. Experimental r...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
Thls thesis presents an algorithm for fault simulation of metal-oxide-semiconductor (MOS), field-eff...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Integrated Circuit (IC) technology is getting more advanced and the number of transistors require...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
This paper describes use of a previously proposed test generation program named Jethro to detect the...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper presents measurements obtained while performing fault simulations of MOS circuits modeled...
Detailed information on a system's behavior in the presence of faults is often vital. It may be used...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
This paper presents a probabilistic approach to the detection of analog faults (i.e., transistors st...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
Thls thesis presents an algorithm for fault simulation of metal-oxide-semiconductor (MOS), field-eff...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Integrated Circuit (IC) technology is getting more advanced and the number of transistors require...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
This paper describes use of a previously proposed test generation program named Jethro to detect the...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper presents measurements obtained while performing fault simulations of MOS circuits modeled...
Detailed information on a system's behavior in the presence of faults is often vital. It may be used...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
This paper presents a probabilistic approach to the detection of analog faults (i.e., transistors st...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
Thls thesis presents an algorithm for fault simulation of metal-oxide-semiconductor (MOS), field-eff...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...