T&H Calibration for Time-Interleaved ADCs

This chapter presents a method to enhance the performance of a time-interleaved ADC, using the open-loop T&H circuit introduced in Chapter 7. 2 The approach is able to measure the mismatches between the various channels of a time-interleaved system on-chip, and to correct for these imperfections by means of analog calibration. The calibration method will be discussed, and both simulation results and experimental results will be shown. Parts of this chapter have been published previously in [77, 78].