The field in the entrance pupil of a high NA lens can be optimized such that, for given incident power, the electric field component in a given direction in the focal point is maximum. If the field component is chosen parallel to the optical axis, the longitudinal component is maximized and it is found that the optimum longitudinal component is narrower than the Airy spot. We discuss how this can be used to obtain higher resolution in photolithography when a resist is used that is sensitive to only the longitudinal component. We describe a proposition for realizing such resist.</p
In this paper we present several algorithms to find pupil functions which give focal fields with dif...
The Rayleigh criterion explains the diffraction limit and provides guidance for improving the perfor...
We present a new approach for calculating the exact electric field distribution behind a perfect hig...
The field in the entrance pupil of a high NA lens can be optimized such that, for given incident pow...
We determine field distributions in the pupil of a high NA lens, that give, for a given power incide...
Closed formulas are presented for the field in the lens pupil for which the longitudinal electric co...
Closed formulas are derived for the field in the focal region of a diffraction limited lens, such th...
We study focused fields which, for a given total power and a given numerical aperture, have maximum ...
We present a new approach for calculating the exact electric field distribution behind a pefect high...
This article describes two- and three-dimensional optical simulations for determining optimal condit...
This article describes two- and three-dimensional optical simulations for determining optimal condit...
Abstract. Numerical aperture NA and partial coherence sigma optimization in optical lithography is i...
The smallest spot sizes are reached by focusing an annular shaped light beam with a high aperture le...
When a Gaussian beam is focused by a lens, the beam is truncated by the pupil, and energy is lost. A...
QC 351 A7 no. 34Despite its necessarily finite aperture, an optical system can theoretically be coat...
In this paper we present several algorithms to find pupil functions which give focal fields with dif...
The Rayleigh criterion explains the diffraction limit and provides guidance for improving the perfor...
We present a new approach for calculating the exact electric field distribution behind a perfect hig...
The field in the entrance pupil of a high NA lens can be optimized such that, for given incident pow...
We determine field distributions in the pupil of a high NA lens, that give, for a given power incide...
Closed formulas are presented for the field in the lens pupil for which the longitudinal electric co...
Closed formulas are derived for the field in the focal region of a diffraction limited lens, such th...
We study focused fields which, for a given total power and a given numerical aperture, have maximum ...
We present a new approach for calculating the exact electric field distribution behind a pefect high...
This article describes two- and three-dimensional optical simulations for determining optimal condit...
This article describes two- and three-dimensional optical simulations for determining optimal condit...
Abstract. Numerical aperture NA and partial coherence sigma optimization in optical lithography is i...
The smallest spot sizes are reached by focusing an annular shaped light beam with a high aperture le...
When a Gaussian beam is focused by a lens, the beam is truncated by the pupil, and energy is lost. A...
QC 351 A7 no. 34Despite its necessarily finite aperture, an optical system can theoretically be coat...
In this paper we present several algorithms to find pupil functions which give focal fields with dif...
The Rayleigh criterion explains the diffraction limit and provides guidance for improving the perfor...
We present a new approach for calculating the exact electric field distribution behind a perfect hig...