The hydride stretching modes of hydrogenated vacancies in amorphous and nanocrystalline silicon:A helpful tool for material characterization
- Smets, A.H.M.
- Matsui, T.
- Kondo, M.
- van de Sanden, M.C.M.
Publication date
December 2009
DOI Publisher
Institute of Electrical and Electronics EngineersAbstract
A model is proposed to assign the hydrogen complexes in amorphous and nano/microcrystalline silicon to the hydride stretching modes in infrared spectra. We demonstrate that this analysis approach is a helpful tool to characterize the material properties of amorphous and microcrystalline silicon.</p
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