Planar concave grating demultiplexers on an InP-membrane on sillicon photonic platform

Abstract—We present measurement results of a 0.25 mm2 footprint eight-channel planar concave grating demultiplexer fabricated in a 300-nm-thick InP membrane adhesively bonded to silicon. The measured cross-talk between the different channels of the device is better than -18 dB, while the insertion loss is 2.8 dB. The power non-uniformity between the channels is 1.2 dB