Bei der Umhüllung mikroelektronischer Bauelemente treten aufgrund der unterschiedlichen thermischen Ausdehnungskoeffizienten der verwendeten Werkstoffe mechanische Belastungen auf, die das Risiko der Rissentstehung und -ausbreitung erhöhen. Da ein solches Versagen in der Umhüllung zum Ausfall des gesamten Systems führen kann, ist es während der Entwicklungsphase nötig, dieses Risiko abzuschätzen, um es zielgerichtet minimieren zu können. Somit wird im Rahmen der vorliegenden Arbeit eine Methodik entwickelt, die es ermöglicht derartige Risse bruchmechanisch beurteilen zu können. Die verwendeten Verkapselungswerkstoffe sind häufig Polymere, die viskoelastisches Werkstoffverhalten aufweisen. An einem Beispiel wird die Charakterisierung dieser ...
Accurate prediction of the thermomechanical yclic behavior of joints and interfaces in semiconductor...
Creep deformation and fracture tests on two polymeric materials were performed at various temperatur...
This review is written in honor of Max L. Williams who not only started this International Journal o...
Cracks inside polymeric packaging materials which are used for protection and isolation of electroni...
Failure of materials and interfaces are commonly linked to the fracture parameters such as the stres...
An important source of interface fracture contributing to adhesive failure in a bimaterial sandwich,...
The demand for Integrated Circuit (IC) has increased tremendously over the years and the dependence ...
The phenomenon of fracture in solids has intrigued scientists and engineers since almost the early d...
The problem of failure of load-bearing structures by fracture is generally important in all phases o...
Research projects concerned with developing a theory of fracture of materials are discussed. The eff...
Fracture mechanical Mode I tensile testing has been performed on an oriented polyproplyne film used ...
Une méthode d'essai évitant le recours à un dispositif par impact a été conçue pour amorcer et faire...
In microelectronics the problem of interconnected materials of different kind (metals, ceramics, pol...
Polymers are widely used in electronic packaging as encapsulants, underfills, adhesives, insulators,...
For many applications a fracture is a disaster, leading to failure of the application and thus its u...
Accurate prediction of the thermomechanical yclic behavior of joints and interfaces in semiconductor...
Creep deformation and fracture tests on two polymeric materials were performed at various temperatur...
This review is written in honor of Max L. Williams who not only started this International Journal o...
Cracks inside polymeric packaging materials which are used for protection and isolation of electroni...
Failure of materials and interfaces are commonly linked to the fracture parameters such as the stres...
An important source of interface fracture contributing to adhesive failure in a bimaterial sandwich,...
The demand for Integrated Circuit (IC) has increased tremendously over the years and the dependence ...
The phenomenon of fracture in solids has intrigued scientists and engineers since almost the early d...
The problem of failure of load-bearing structures by fracture is generally important in all phases o...
Research projects concerned with developing a theory of fracture of materials are discussed. The eff...
Fracture mechanical Mode I tensile testing has been performed on an oriented polyproplyne film used ...
Une méthode d'essai évitant le recours à un dispositif par impact a été conçue pour amorcer et faire...
In microelectronics the problem of interconnected materials of different kind (metals, ceramics, pol...
Polymers are widely used in electronic packaging as encapsulants, underfills, adhesives, insulators,...
For many applications a fracture is a disaster, leading to failure of the application and thus its u...
Accurate prediction of the thermomechanical yclic behavior of joints and interfaces in semiconductor...
Creep deformation and fracture tests on two polymeric materials were performed at various temperatur...
This review is written in honor of Max L. Williams who not only started this International Journal o...