We compare the structural properties of InN and In0.95Ga0.05N films grown on O-face ZnO(000 (1) over bar) substrates at different temperatures. The small amount of Ga results in dramatic changes in the morphology and structural properties of InN. In particular, inversion domains start to appear at higher temperatures in the In0.95Ga0.05N film. This process is a consequence of the chemical reaction of ZnO with Ga which can be prevented by choosing the substrate temperature to be 450 degrees C or below. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4739941
We report the catalyst free growth of wurtzite InN nanorods (NRs) and microislands on bare Si(111) b...
Continued development of GaN-based light emitting diodes is being hampered by constraints imposed b...
We have used positron annihilation spectroscopy to determine the nature and the concentrations of th...
We compare the structural properties of InN and In0.95Ga0.05N films grown on O-face ZnO(000 (1) over...
We study the impact of substrate temperature and layer thickness on the morphological and structural...
The mobility of indium on the Zn-polar (0001) surface of single crystal ZnO wafers was investigated ...
The authors have applied positron annihilation spectroscopy to study the effect of different growth ...
We have investigated the structural and optical properties of Ga-doped ZnO films grown on GaN templa...
The effect of Ga/N flux ratio on surface morphology, incorporation of point defects and electrical t...
Journal ArticlePresents doping studies of gallium[sub0.5] indium[sub0.5] phosphorus organometallic v...
ZnO is considered as a promising substrate for GaNepitaxy because of stacking match and close lattic...
InAlN epilayers deposited on thick GaN buffer layers grown by metalorganic chemical vapour depositio...
We have applied a slow positron beam to study InN samples grown by metal-organic vapor-phase epitaxy...
We report on the consistent measurement of gallium incorporation in nominal InAlN layers using vario...
Indium nitride (InN) exists in two different structural phases, the equilibrium wurtzite (w) and the...
We report the catalyst free growth of wurtzite InN nanorods (NRs) and microislands on bare Si(111) b...
Continued development of GaN-based light emitting diodes is being hampered by constraints imposed b...
We have used positron annihilation spectroscopy to determine the nature and the concentrations of th...
We compare the structural properties of InN and In0.95Ga0.05N films grown on O-face ZnO(000 (1) over...
We study the impact of substrate temperature and layer thickness on the morphological and structural...
The mobility of indium on the Zn-polar (0001) surface of single crystal ZnO wafers was investigated ...
The authors have applied positron annihilation spectroscopy to study the effect of different growth ...
We have investigated the structural and optical properties of Ga-doped ZnO films grown on GaN templa...
The effect of Ga/N flux ratio on surface morphology, incorporation of point defects and electrical t...
Journal ArticlePresents doping studies of gallium[sub0.5] indium[sub0.5] phosphorus organometallic v...
ZnO is considered as a promising substrate for GaNepitaxy because of stacking match and close lattic...
InAlN epilayers deposited on thick GaN buffer layers grown by metalorganic chemical vapour depositio...
We have applied a slow positron beam to study InN samples grown by metal-organic vapor-phase epitaxy...
We report on the consistent measurement of gallium incorporation in nominal InAlN layers using vario...
Indium nitride (InN) exists in two different structural phases, the equilibrium wurtzite (w) and the...
We report the catalyst free growth of wurtzite InN nanorods (NRs) and microislands on bare Si(111) b...
Continued development of GaN-based light emitting diodes is being hampered by constraints imposed b...
We have used positron annihilation spectroscopy to determine the nature and the concentrations of th...