Worst-case design uses extreme process corner conditions which rarely occur. This costs additional power due to area over-dimensioning during synthesis. We present a new design strategy for digital CMOS IP that makes use of forward body biasing. Our approach renders consistently a better performance-per-area ratio by constraining circuit over-dimensioning without sacrificing circuit performance. Dynamic power is reduced depending upon the ratio of flip-flops to logic-gates, and data activity. On a set of benchmark circuits in 65 nm LP-CMOS, we observed performance-per-area improvements up to 81%, area and leakage reductions up to 38%, and total power savings of up to 26% without performance penalties
We present techniques to determine the optimal body bias (forward or reverse) to minimize leakage cu...
Abstract-Leakage current is susceptible to variation of transistor parameters and environment such a...
Body biasing is commonly used in digital and low-power analog integrated circuits to adjust the thre...
Worst-case design uses extreme process corner conditions which rarely occur. This costs additional p...
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum spe...
We present a design methodology towards minimum-area maximum-performance designs in sub-/ near-thres...
The continuous shrinking size of transistors have resulted in faster devices and there is never endi...
We propose a new fully-integrated forward body bias (FBB) generator that holds its voltage constant ...
In modern System-on-Chip (SoC) designs, the fulfillment of power constraints is one of the most impo...
In modern System-on-Chip (SoC) designs, the fulfillment of power constraints is one of the most impo...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
session: FDSOI Circuits 2International audienceIn this paper, a built-in Body Bias design methodolog...
We present techniques to determine the optimal body bias (forward or reverse) to minimize leakage cu...
Abstract-Leakage current is susceptible to variation of transistor parameters and environment such a...
Body biasing is commonly used in digital and low-power analog integrated circuits to adjust the thre...
Worst-case design uses extreme process corner conditions which rarely occur. This costs additional p...
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum spe...
We present a design methodology towards minimum-area maximum-performance designs in sub-/ near-thres...
The continuous shrinking size of transistors have resulted in faster devices and there is never endi...
We propose a new fully-integrated forward body bias (FBB) generator that holds its voltage constant ...
In modern System-on-Chip (SoC) designs, the fulfillment of power constraints is one of the most impo...
In modern System-on-Chip (SoC) designs, the fulfillment of power constraints is one of the most impo...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
session: FDSOI Circuits 2International audienceIn this paper, a built-in Body Bias design methodolog...
We present techniques to determine the optimal body bias (forward or reverse) to minimize leakage cu...
Abstract-Leakage current is susceptible to variation of transistor parameters and environment such a...
Body biasing is commonly used in digital and low-power analog integrated circuits to adjust the thre...