Add to ORKGImportance Sampling allows for efficient Monte Carlo sampling that also properly covers tails of distributions. From Large Deviation Theory we derive an optimal upper bound for the number of samples to efficiently sample for an accurate fail probability $ P_{fail} \leq 10^{-10} $. We apply this to accurately and efficiently minimize the access time of Static Random Access Memory (SRAM), while guaranteeing a statistical constraint on the yield target
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Abstract—Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail≤10-1...
Modern communication and identification products impose demanding constraints on reliability of comp...
A product may fail when design parameters are subject to large deviations. To guarantee yield one li...
Importance Sampling allows for efficient Monte Carlo sampling that also properly covers tails of dis...
Summary. Importance Sampling allows for efficient Mon-te Carlo Sampling that also properly covers ta...
As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technolog...
For robust design of SRAM memories, it is not sufficient to guarantee good statistical margins on th...
Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail=10-10 have to...
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Abstract—Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail≤10-1...
Modern communication and identification products impose demanding constraints on reliability of comp...
A product may fail when design parameters are subject to large deviations. To guarantee yield one li...
Importance Sampling allows for efficient Monte Carlo sampling that also properly covers tails of dis...
Summary. Importance Sampling allows for efficient Mon-te Carlo Sampling that also properly covers ta...
As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technolog...
For robust design of SRAM memories, it is not sufficient to guarantee good statistical margins on th...
Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail=10-10 have to...
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Abstract—Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail≤10-1...
Modern communication and identification products impose demanding constraints on reliability of comp...