As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technology generation, they become increasingly susceptible to statistical variations in their parameters. These statistical variations can result in failing memory. SRAM is used as a building block for the construction of large Integrated Circuits (IC). To ensure SRAM does not degrade the yield (fraction of functional devices) of ICs, very low failure probabilities of Pfail = 10-10 are strived for. For instance in SRAMmemory design one aims to get a 0.1% yield loss for 10Mbit memory, which means that 1 in 10 billion cells fails (Pfail = 10-10; this corresponds with an occurrence of -6.4s when dealing with a normal distribution). To simulate such prob...
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Summary. Importance Sampling allows for efficient Mon-te Carlo Sampling that also properly covers ta...
SRAM (static random-access memory) has been widely embedded in a large amount of semiconductor chips...
As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technolog...
Abstract—Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail≤10-1...
Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail=10-10 have to...
Importance Sampling allows for efficient Monte Carlo sampling that also properly covers tails of dis...
Importance sampling has had its origin in Monte Carlo simulation and in the last 15 years or so, it ...
A product may fail when design parameters are subject to large deviations. To guarantee yield one li...
The dimension of transistors shrinks with each new technology developed in the semiconductor industr...
Modern communication and identification products impose demanding constraints on reliability of comp...
Abstract—Memory circuits have become important components in today’s IC designs which demands extrem...
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Summary. Importance Sampling allows for efficient Mon-te Carlo Sampling that also properly covers ta...
SRAM (static random-access memory) has been widely embedded in a large amount of semiconductor chips...
As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technolog...
Abstract—Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail≤10-1...
Variability is an important aspect of SRAM cell design. Failure probabilities of Pfail=10-10 have to...
Importance Sampling allows for efficient Monte Carlo sampling that also properly covers tails of dis...
Importance sampling has had its origin in Monte Carlo simulation and in the last 15 years or so, it ...
A product may fail when design parameters are subject to large deviations. To guarantee yield one li...
The dimension of transistors shrinks with each new technology developed in the semiconductor industr...
Modern communication and identification products impose demanding constraints on reliability of comp...
Abstract—Memory circuits have become important components in today’s IC designs which demands extrem...
Abstract—With process variation becoming a growing concern in deep submicron technologies, the abili...
Summary. Importance Sampling allows for efficient Mon-te Carlo Sampling that also properly covers ta...
SRAM (static random-access memory) has been widely embedded in a large amount of semiconductor chips...