This paper focuses on benchmarking, which is the main experimental approach to the design method and EDA-tool analysis, characterization and evaluation. We discuss the importance and difficulties of benchmarking, as well as the recent research effort related to it. To resolve several serious problems related to quality of benchmarking and use of practical industrial benchmarks, we proposed an adequate benchmarking methodology based on the statistical experimental design approach, and developed corresponding digital circuit benchmark generators. These benchmark generators enable research, evaluation and fine-tuning of circuit synthesis methods and EDA-tools largely independent of the actual industrial benchmarks, and much better than having ...
This paper discusses issues in benchmarking for synthesis, and suggests techniques for the compariso...
In this paper, we present Auto-BET-AMS, an automated device, circuit and system-level simulation pla...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
This paper focuses on benchmarking, which is the main experimental approach to the design method and...
This paper focuses on benchmarking, which is the main experimental approach to the design method and...
In the paper, our research activities are described briefly. In the beginning, two different methodo...
For the development and evaluation of CAD-tools for partition-ing, floorplanning, placement, and rou...
For the development and evaluation of CAD-tools for the layout, placement, and routing of digital d...
For the development and evaluation of CAD-tools for partitioning, floorplanning, placement, and rout...
Abstract — In this paper we present an experimental analysis of robustness of Electronic Design Auto...
grantor: University of TorontoThe development of new architectures for Field-Programmable ...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
This paper presents a new real-world application of evolutionary computing in the area of digital ci...
. Despite more than a decade of experience with the use of standardized benchmark circuits, meaningf...
This paper discusses issues in benchmarking for synthesis, and suggests techniques for the compariso...
In this paper, we present Auto-BET-AMS, an automated device, circuit and system-level simulation pla...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
This paper focuses on benchmarking, which is the main experimental approach to the design method and...
This paper focuses on benchmarking, which is the main experimental approach to the design method and...
In the paper, our research activities are described briefly. In the beginning, two different methodo...
For the development and evaluation of CAD-tools for partition-ing, floorplanning, placement, and rou...
For the development and evaluation of CAD-tools for the layout, placement, and routing of digital d...
For the development and evaluation of CAD-tools for partitioning, floorplanning, placement, and rout...
Abstract — In this paper we present an experimental analysis of robustness of Electronic Design Auto...
grantor: University of TorontoThe development of new architectures for Field-Programmable ...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
This paper presents a new real-world application of evolutionary computing in the area of digital ci...
. Despite more than a decade of experience with the use of standardized benchmark circuits, meaningf...
This paper discusses issues in benchmarking for synthesis, and suggests techniques for the compariso...
In this paper, we present Auto-BET-AMS, an automated device, circuit and system-level simulation pla...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...