The morphology of conductive nanocomposites consisting of low concentration of single-wall carbon nanotubes (SWNT) and polystyrene (PS) has been studied using atomic force microscopy (AFM), transmission electron microscopy (TEM) and, in particular, scanning electron microscopy (SEM). Application of charge contrast imaging in SEM allows visualization of the overall SWNT dispersion within the polymer matrix as well as the identification of individual or bundled SWNTs at high resolution. The contrast mechanism involved will be discussed. In conductive nanocomposites the SWNTs are homogeneously dispersed within the polymer matrix and form a network. Beside fairly straight SWNTs, strongly bended SWNTs have been observed. However, for samples wit...
The characterization of dispersion and connectivity of carbon nanotube (CNT) networks inside polymer...
For the first time local electrical characteristics of a blend of two semiconducting polymers were s...
Semiconductive composites have been examined using advanced scanning electron microscopy (SEM). For ...
The morphology of conductive nanocomposites consisting of low concentration of single-wall carbon na...
High-resolution sub-surface imaging of carbon nanotube (CNT) networks within polymer nanocomposites ...
The performance of field-effect transistors based on single-walled carbon nanotube (SWCNT) networks ...
The current percolation in polymer-sorted semiconducting (7,5) single-walled carbon nanotube (SWNT) ...
Conductive atomic force microscopy (C-AFM) is a valuable technique for correlating the electrical pr...
The ability to examine conducting filler particles in an insulating polymer matrix by scanning elect...
Single-walled and multi-walled carbon nanotubes (SWNTs and MWNTs) were characterised as-produced, af...
THESIS 9389In order to build electronic devices and circuits comprised of nanoscale materials as the...
Characterization of polymer nanocomposites by electron microscopy has been attempted since last deca...
Despite many studies of subsurface imaging of carbon nanotube (CNT)-polymer composites via scanning ...
Single walled carbon nanotubes (SWCNTs) are carbon based nanostructures with extraordinary electroni...
Comparison of AFM and SEM images of single walled carbon nanotubes (SWNTs) grown within a dielectric...
The characterization of dispersion and connectivity of carbon nanotube (CNT) networks inside polymer...
For the first time local electrical characteristics of a blend of two semiconducting polymers were s...
Semiconductive composites have been examined using advanced scanning electron microscopy (SEM). For ...
The morphology of conductive nanocomposites consisting of low concentration of single-wall carbon na...
High-resolution sub-surface imaging of carbon nanotube (CNT) networks within polymer nanocomposites ...
The performance of field-effect transistors based on single-walled carbon nanotube (SWCNT) networks ...
The current percolation in polymer-sorted semiconducting (7,5) single-walled carbon nanotube (SWNT) ...
Conductive atomic force microscopy (C-AFM) is a valuable technique for correlating the electrical pr...
The ability to examine conducting filler particles in an insulating polymer matrix by scanning elect...
Single-walled and multi-walled carbon nanotubes (SWNTs and MWNTs) were characterised as-produced, af...
THESIS 9389In order to build electronic devices and circuits comprised of nanoscale materials as the...
Characterization of polymer nanocomposites by electron microscopy has been attempted since last deca...
Despite many studies of subsurface imaging of carbon nanotube (CNT)-polymer composites via scanning ...
Single walled carbon nanotubes (SWCNTs) are carbon based nanostructures with extraordinary electroni...
Comparison of AFM and SEM images of single walled carbon nanotubes (SWNTs) grown within a dielectric...
The characterization of dispersion and connectivity of carbon nanotube (CNT) networks inside polymer...
For the first time local electrical characteristics of a blend of two semiconducting polymers were s...
Semiconductive composites have been examined using advanced scanning electron microscopy (SEM). For ...