The surface roughness of the substrate itself could play an important role for the bonding at the interface. In this paper, a correlation of the surface roughness of a rigid alumina substrate and its 2D model of estimated surface area has been studied using Atomic Force Microscopy (AFM). With rougher surface, the adhesive strength between a deposited copper film and the alumina substrate is higher due to the larger contact area at the interface. For 99.99% pure copper–96% pure alumina, this effect can account for an adhesive strength increment of more than 50%.ASTAR (Agency for Sci., Tech. and Research, S’pore)Accepted versio
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
This report briefly reviews the measurements and interpretation of adhesion forces between microscop...
At the molecular scale, there are strong attractive interactions between surfaces, yet few macroscop...
The surface roughness of the substrate itself could play an important role for the bonding at the in...
The evaluation of bonding mechanisms between magnetron sputtered copper (Cu) thin films and a cerami...
The evaluation of bonding mechanisms between magnetron sputtered copper (Cu) thin films and a cerami...
Adhesion between rough surfaces is an important property of interfaces and is one that has far-reach...
It is shown that a self-affine roughness at the junction of an elastic film and a hard solid substra...
This thesis describes the study of adhesion between rough solids from a contact mechanics approach u...
This thesis describes the study of adhesion between rough solids from a contact mechanics approach u...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
This report briefly reviews the measurements and interpretation of adhesion forces between microscop...
At the molecular scale, there are strong attractive interactions between surfaces, yet few macroscop...
The surface roughness of the substrate itself could play an important role for the bonding at the in...
The evaluation of bonding mechanisms between magnetron sputtered copper (Cu) thin films and a cerami...
The evaluation of bonding mechanisms between magnetron sputtered copper (Cu) thin films and a cerami...
Adhesion between rough surfaces is an important property of interfaces and is one that has far-reach...
It is shown that a self-affine roughness at the junction of an elastic film and a hard solid substra...
This thesis describes the study of adhesion between rough solids from a contact mechanics approach u...
This thesis describes the study of adhesion between rough solids from a contact mechanics approach u...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface ...
This report briefly reviews the measurements and interpretation of adhesion forces between microscop...
At the molecular scale, there are strong attractive interactions between surfaces, yet few macroscop...