In the current work, a test scheme to evaluate solder joint interface fracture toughness using double cantilever beam (DCB) test has been successfully demonstrated. The obtained results, in terms of critical energy release rate, predict the joint failure based on the principle of fracture mechanics. The results can be used as a materials property in the reliability design of various types of solder-ball joined packages. DCB specimens made of 99.9 wt% copper were selected in the current work. Eutectic Sn-37Pb and lead-free Sn-3.5Ag-0.5Cu solders were used to join two pieces of the copper beams with controlled solder thickness. The test record showed steady propagation of the crack along the solder / copper interface, which verifies the viabi...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The interfacial reaction between the solder/Cu plate and the joint strength of the solder joint with...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
Conventional assessment of solder joint reliability uses either ball shear test or solder ball pull ...
Double cantilever beam (DCB) specimens with distinct intermetallic microstructures and different geo...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fr...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Three new tests--the unsymmetric double cantilever beam (UDCB) test, the single leg bending (SLB) te...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
It is well known that high temperature thermal aging can increase the thickness of the IMC layer of ...
This work utilizes the lap shear test to investigate the shear strength and fracture behaviour of el...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The interfacial reaction between the solder/Cu plate and the joint strength of the solder joint with...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
Conventional assessment of solder joint reliability uses either ball shear test or solder ball pull ...
Double cantilever beam (DCB) specimens with distinct intermetallic microstructures and different geo...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fr...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Three new tests--the unsymmetric double cantilever beam (UDCB) test, the single leg bending (SLB) te...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
It is well known that high temperature thermal aging can increase the thickness of the IMC layer of ...
This work utilizes the lap shear test to investigate the shear strength and fracture behaviour of el...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
In Microelectronic and MEMS (Micro-Electro-Mechanical Systems) applications the volume of solder joi...
The interfacial reaction between the solder/Cu plate and the joint strength of the solder joint with...