Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mobile electronics, wireless sensor nodes, implantable biomedical devices, etc. Due to high computing capability requirements in such applications, SRAMs play a critical role in energy consumption. This paper presents SRAM energy analysis utilizing multi-threshold (multi-Vth) voltage devices and various circuit techniques for power reduction and performance improvement, and suggests optimal device combinations for energy efficiency improvement. In general, higher-Vth devices are preferred in the cross-coupled latches and the write access transistors for reducing leakage current while lower-Vth devices are desired in the read port for implementi...
This book features various, ultra low energy, variability resilient SRAM circuit design techniques f...
Embedded memories play a pivotal role in VLSI systems to support the increasing need of data storage...
The performance of the cell deteriorates, when static random access memory (SRAM) cell is operated b...
Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mo...
Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devi...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Technology advancement has brought about the continuous scaling of transistors sizes.The decreasing ...
The aggressive CMOS technology shrinking driven by cost reduction, performance improvement and power...
With the development of CMOS technology, the performance including power dissipation and operation s...
option for CMOS ICs. As the supply voltage of low-power ICs decreases, it must remain compatible wit...
A new seven transistors (7T) dual threshold voltage SRAM cell is proposed in this paper for simultan...
High energy efficient ultra-low voltage SRAMs play a key role in many emerging ultra-low power appli...
UnrestrictedIn today's IC design, one of the key challenges is the increase in power dissipation of ...
With ever raising demands of battery operated portable device in market is encouraging the VLSI make...
As the development of complex metal oxide semiconductor (CMOS) technology, fast low-power static ran...
This book features various, ultra low energy, variability resilient SRAM circuit design techniques f...
Embedded memories play a pivotal role in VLSI systems to support the increasing need of data storage...
The performance of the cell deteriorates, when static random access memory (SRAM) cell is operated b...
Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mo...
Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devi...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Technology advancement has brought about the continuous scaling of transistors sizes.The decreasing ...
The aggressive CMOS technology shrinking driven by cost reduction, performance improvement and power...
With the development of CMOS technology, the performance including power dissipation and operation s...
option for CMOS ICs. As the supply voltage of low-power ICs decreases, it must remain compatible wit...
A new seven transistors (7T) dual threshold voltage SRAM cell is proposed in this paper for simultan...
High energy efficient ultra-low voltage SRAMs play a key role in many emerging ultra-low power appli...
UnrestrictedIn today's IC design, one of the key challenges is the increase in power dissipation of ...
With ever raising demands of battery operated portable device in market is encouraging the VLSI make...
As the development of complex metal oxide semiconductor (CMOS) technology, fast low-power static ran...
This book features various, ultra low energy, variability resilient SRAM circuit design techniques f...
Embedded memories play a pivotal role in VLSI systems to support the increasing need of data storage...
The performance of the cell deteriorates, when static random access memory (SRAM) cell is operated b...