A 5.61 pJ, 16 kb 9T SRAM is implemented in 65nm CMOS technology. A single-ended equalized bitline scheme is proposed to improve both read bitline voltage swing and sensing timing window. A fast local write-back allows the half-select-free write operation without performance degradation. The test chip shows a minimum operating voltage of 0.24V and a minimum energy of 5.61pJ at 0.3V
SRAMs occupy a large amount of area in modern system on chip circuits. With the growing trend of dev...
This work aims to reduce the read power consumption as well as to enhance the stability of the SRAM ...
With the development of CMOS technology, the performance including power dissipation and operation s...
A 5.61 pJ, 16 kb 9T SRAM is implemented in 65nm CMOS technology. A single-ended equalized bitline sc...
A voltage scalable 0.26 V, 64 kb 8T SRAM with 512 cells per bitline is implemented in a 130 nm CMOS ...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Four circuit techniques for high data stability and low power consumption in static CMOS memory circ...
In this paper, we present Dynamic Voltage and Frequency Managed 256 x 64 SRAM block in 65nm technolo...
In this paper, we present dynamic voltage and frequency Managed 256 x 64 SRAM block in 65 nm technol...
International audienceSRAM operation at subthreshold/weak inversion region provides a significant po...
As CMOS technology continuously scales, the process variability becomes a major challenge in designi...
We propose an ultra-low power memory design method based on the ultra-low (∼ 0.2 V) write-bitline vo...
A small bitline sensing margin is one of the most challenging design obstacles for reliable ultra-lo...
An extremely low energy per operation, single cycle 32 bit/word, 128 kb SRAM is fabricated in 90 nm ...
textThis report discusses the design of read/write assist circuits which are used in a SRAM cell’s d...
SRAMs occupy a large amount of area in modern system on chip circuits. With the growing trend of dev...
This work aims to reduce the read power consumption as well as to enhance the stability of the SRAM ...
With the development of CMOS technology, the performance including power dissipation and operation s...
A 5.61 pJ, 16 kb 9T SRAM is implemented in 65nm CMOS technology. A single-ended equalized bitline sc...
A voltage scalable 0.26 V, 64 kb 8T SRAM with 512 cells per bitline is implemented in a 130 nm CMOS ...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Four circuit techniques for high data stability and low power consumption in static CMOS memory circ...
In this paper, we present Dynamic Voltage and Frequency Managed 256 x 64 SRAM block in 65nm technolo...
In this paper, we present dynamic voltage and frequency Managed 256 x 64 SRAM block in 65 nm technol...
International audienceSRAM operation at subthreshold/weak inversion region provides a significant po...
As CMOS technology continuously scales, the process variability becomes a major challenge in designi...
We propose an ultra-low power memory design method based on the ultra-low (∼ 0.2 V) write-bitline vo...
A small bitline sensing margin is one of the most challenging design obstacles for reliable ultra-lo...
An extremely low energy per operation, single cycle 32 bit/word, 128 kb SRAM is fabricated in 90 nm ...
textThis report discusses the design of read/write assist circuits which are used in a SRAM cell’s d...
SRAMs occupy a large amount of area in modern system on chip circuits. With the growing trend of dev...
This work aims to reduce the read power consumption as well as to enhance the stability of the SRAM ...
With the development of CMOS technology, the performance including power dissipation and operation s...