Burn-in test is widely used to improve the product reliability from the customer's perspective by identifying and screening out defective individuals before they are marketed. For those high reliable products whose failures are caused by gradual degradation, burn-in test not only could pick out weak units, but also increases the degradation of normal units, and hence the test duration is regarded as one key factor in the test policy optimization. In this paper, a new burn-in framework is proposed, which combines a sliding window strategy with one-dimensional convolutional neural network, completes the off-line training for classification model, and then obtains the optimal burn-in time with a group-accuracy strategy. And an online optimizat...
Integrated quality and reliability models should be developed to improve system performance simultan...
Yield and reliability are two key factors affecting costs and profits in the semiconductor industry....
In this research we present two approaches for determining the optimal burn-in time of recre-ational...
[[abstract]]Burn-in test has been widely used by many manufactures of electronic products to elimina...
Burn-in is an effective and widely used means to improve product reliability by eliminating weak uni...
[[abstract]]Burn-in test is a manufacturing process applied to products to eliminate latent failures...
Motivated by the two-phase degradation phenomena observed in light displays (e.g., plasma display pa...
This paper presents a degradation-based model to jointly determine the optimal burn-in, inspection, ...
The cost of Burn-In is a major concern for the testing of Automotive Systems-on-Chip (SoCs). This pa...
[[abstract]]Burn-in test is helpful to improve the reliability of Integrated Circuit (IC). It can sc...
In this paper it is shown that the bathtub-curve (BTC) based time-derivative of the failure rate at ...
Warranty data analyses reveal that products sold with two-dimensional warranties may have significan...
Burn-in is a widely used engineering method which is adopted to eliminate defective items before the...
In this brief-review some important published work on burn-in-testing (BIT) in electronics and photo...
In this brief-review some important published work on burn-in-testing (BIT) in electronics and photo...
Integrated quality and reliability models should be developed to improve system performance simultan...
Yield and reliability are two key factors affecting costs and profits in the semiconductor industry....
In this research we present two approaches for determining the optimal burn-in time of recre-ational...
[[abstract]]Burn-in test has been widely used by many manufactures of electronic products to elimina...
Burn-in is an effective and widely used means to improve product reliability by eliminating weak uni...
[[abstract]]Burn-in test is a manufacturing process applied to products to eliminate latent failures...
Motivated by the two-phase degradation phenomena observed in light displays (e.g., plasma display pa...
This paper presents a degradation-based model to jointly determine the optimal burn-in, inspection, ...
The cost of Burn-In is a major concern for the testing of Automotive Systems-on-Chip (SoCs). This pa...
[[abstract]]Burn-in test is helpful to improve the reliability of Integrated Circuit (IC). It can sc...
In this paper it is shown that the bathtub-curve (BTC) based time-derivative of the failure rate at ...
Warranty data analyses reveal that products sold with two-dimensional warranties may have significan...
Burn-in is a widely used engineering method which is adopted to eliminate defective items before the...
In this brief-review some important published work on burn-in-testing (BIT) in electronics and photo...
In this brief-review some important published work on burn-in-testing (BIT) in electronics and photo...
Integrated quality and reliability models should be developed to improve system performance simultan...
Yield and reliability are two key factors affecting costs and profits in the semiconductor industry....
In this research we present two approaches for determining the optimal burn-in time of recre-ational...