The Kelvin Probe (KP) is a non-contact, non-destructive vibrating capacitor device used to measure the work function difference, or for non-metals, the surface potential, between a conducting specimen and a vibrating tip. The Kelvin method was firstly postulated by the renowned Scottish scientist W. Thomson, later Lord Kelvin, in 1861. In this work, a high vacuum KP system incorporating with light source is setup to characterize the surface photo-response of novel nanosized semiconductive metal oxides( NMO) materials, which possess superior photocatalytic properties. [4th Award
In recent years, Kelvin probe force microscopy (KPFM) has emerged as a versatile toolkit for explori...
Nanoscience promises to transform today's world in the same way that integrated semiconductor device...
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as op...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
This thesis reports design and construction of a novel Scanning Kelvin probe (SKP) compatible with t...
We present a new instrument for contact potential measurements, combining the well-known principle o...
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique a...
AbstractWe describe a novel dual-mode Kelvin probe featuring ambient pressure Photoemission Spectros...
AbstractWe describe a novel photoemission technique utilizing a traditional Kelvin probe as a detect...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
Abstract. A home-built Kelvin force microscope combined with a spectroscopic method is dedicated to ...
This article describes a new type of in situ ultrahigh‐vacuum compatible kelvin probe based on a voi...
Kelvin probe force microscopy (KPFM) is capable of detecting surface potential (SP) distribution of ...
Cette thèse propose, décrit et utilise un ensemble de techniques basées sur la microscopie à force a...
In recent years, Kelvin probe force microscopy (KPFM) has emerged as a versatile toolkit for explori...
Nanoscience promises to transform today's world in the same way that integrated semiconductor device...
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as op...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
This thesis reports design and construction of a novel Scanning Kelvin probe (SKP) compatible with t...
We present a new instrument for contact potential measurements, combining the well-known principle o...
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique a...
AbstractWe describe a novel dual-mode Kelvin probe featuring ambient pressure Photoemission Spectros...
AbstractWe describe a novel photoemission technique utilizing a traditional Kelvin probe as a detect...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
Abstract. A home-built Kelvin force microscope combined with a spectroscopic method is dedicated to ...
This article describes a new type of in situ ultrahigh‐vacuum compatible kelvin probe based on a voi...
Kelvin probe force microscopy (KPFM) is capable of detecting surface potential (SP) distribution of ...
Cette thèse propose, décrit et utilise un ensemble de techniques basées sur la microscopie à force a...
In recent years, Kelvin probe force microscopy (KPFM) has emerged as a versatile toolkit for explori...
Nanoscience promises to transform today's world in the same way that integrated semiconductor device...
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as op...