Basic Reliability Tools for SHM protocols

International audienceElectronics components and devices, including equipment to systems, are fabricated from materials and structures that degrade with time under normal operational condition. It is necessary to anticipate and quantify system failure occurrence but the goal of "reliability engineering" is to clarify first the failure paradigm in term of statistics and Physics of Failure or simply Part Count approach. Many statistical approaches and underlying mathematics have been developed in the past decades of the last century to describe failure rates and the well-known bathtub curve showing a schematic of failure rate behavior with time. From Wikipedia definition, predictive (or logical) analysis encompasses a variety of techniques derived from statistics, data extraction and game theory that analyze past and present facts to make predictive assumptions about future events. In this applied reliability chapter, we would like to share our perception on the experimentally development applied on existing reliability and maintenance paradigms developed since decades by many authors and papers. This Part I titled "Reliability Basic Tools for SHM protocols" aims to remind a) how applied engineering in predicting failure and monitoring SHM of electronic equipment and systems are implemented and b) to present basic statistic tools defined for reliability modelling implementation and studies related to active microelectronic parts. The second Part II is dedicated to the experimental application titled "Applied Engineering on Physics-of-Healthy and SHM on microelectronic equipment for aeronautic, space, automotive and transport operation" addressing how innovative technologies and Commercial-Off-The-Shelf (COTS) devices are pondered