Recently, simultaneous monitoring of process mean and variability has gained increasing attention. By departing from the accurate measurements assumption, this paper investigates the effect of gauge measurement errors on the performance of the maximum generally weighted moving average (Max-GWMA) chart for simultaneous monitoring of process mean and variability under an additive covariate model. Multiple measurements procedure is employed to compensate for the undesired impact of gauge inaccuracy on detection capability of the MaxGWMA chart. Simulation experiments in terms of average run length (ARL) are conducted to assess the power of the developed chart to detect different out-of-control scenarios. The results confirm that the gauge inacc...
The combined effect of two real-world-occurring phenomena: ‘measurement errors’ and ‘autocorrelation...
Monitoring algorithms, such as the Shewhart and Cusum control charts, are often used for monitoring ...
Excessive variation in a manufacturing process is one of the major causes of a high defect rate and ...
Single control charts are widely used to control assignable causes that shift the process due to var...
[[abstract]]The effect of measurement error on the performance of two control chart schemes, derived...
Two generally weighted moving average (GWMA) charts are usually used concurrently for a simultaneou...
The accuracy of the measurement system is vital for reliable process monitoring using statistical pr...
International audienceThe effect of measurement errors on adaptive Shewhart charts have been investi...
Abstract Measurement error (M.E) can have a substantial impact on quality control applications, dimi...
無In this article, a two-step process is considered to investigate the effects of measurement errors ...
peer reviewedIn the literature, coefficient of variation control charts have been introduced under t...
Measurement error is a usually met distortion factor in real-world applications that influences the ...
International audienceInvestigating the effect of measurement errors on the control chart monitoring...
Monitoring algorithms, such as the Shewhart and Cusum control charts, are often used in environmenta...
International audienceIn the literature, coefficient of variation control charts have been introduce...
The combined effect of two real-world-occurring phenomena: ‘measurement errors’ and ‘autocorrelation...
Monitoring algorithms, such as the Shewhart and Cusum control charts, are often used for monitoring ...
Excessive variation in a manufacturing process is one of the major causes of a high defect rate and ...
Single control charts are widely used to control assignable causes that shift the process due to var...
[[abstract]]The effect of measurement error on the performance of two control chart schemes, derived...
Two generally weighted moving average (GWMA) charts are usually used concurrently for a simultaneou...
The accuracy of the measurement system is vital for reliable process monitoring using statistical pr...
International audienceThe effect of measurement errors on adaptive Shewhart charts have been investi...
Abstract Measurement error (M.E) can have a substantial impact on quality control applications, dimi...
無In this article, a two-step process is considered to investigate the effects of measurement errors ...
peer reviewedIn the literature, coefficient of variation control charts have been introduced under t...
Measurement error is a usually met distortion factor in real-world applications that influences the ...
International audienceInvestigating the effect of measurement errors on the control chart monitoring...
Monitoring algorithms, such as the Shewhart and Cusum control charts, are often used in environmenta...
International audienceIn the literature, coefficient of variation control charts have been introduce...
The combined effect of two real-world-occurring phenomena: ‘measurement errors’ and ‘autocorrelation...
Monitoring algorithms, such as the Shewhart and Cusum control charts, are often used for monitoring ...
Excessive variation in a manufacturing process is one of the major causes of a high defect rate and ...