Add to ORKGAs an approach towards automated contactless IC probing we describe a laser beam test system for failure analysis in digital CMOS circuits coupled to the CAD data base. The CAD coupling was realized between a VME host and a VAX computer. Task control and image processing is done by a VME control process. After introducing the hard- and software of the realized configuration a typical application example explains the system performance
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
SIGLECNRS RS 17660 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
Laser beam testing of integrated circuits is still largely an unexploited field. Optical beam induce...
Laser beam testing of integrated circuits is still largely an unexploited field. Optical beam induce...
The laser scanning microscope (LSM) is a fairly new device for contactless testing. The nondestructi...
Optical beam testing methods offer several advantages with respect to conventional Scanning Electron...
ISBN: 0818607262A strategy is derived for failure analysis in random logic devices such as microproc...
We describe a modular software environment for a non-destructive automated digital test system using...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
The Failure analysis plays an important role in the improvement of the performances and themanufactu...
A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling ...
The purpose of this project was to develop an automated test system for laser control circuit board ...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
SIGLECNRS RS 17660 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
Laser beam testing of integrated circuits is still largely an unexploited field. Optical beam induce...
Laser beam testing of integrated circuits is still largely an unexploited field. Optical beam induce...
The laser scanning microscope (LSM) is a fairly new device for contactless testing. The nondestructi...
Optical beam testing methods offer several advantages with respect to conventional Scanning Electron...
ISBN: 0818607262A strategy is derived for failure analysis in random logic devices such as microproc...
We describe a modular software environment for a non-destructive automated digital test system using...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
The Failure analysis plays an important role in the improvement of the performances and themanufactu...
A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling ...
The purpose of this project was to develop an automated test system for laser control circuit board ...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
SIGLECNRS RS 17660 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...