Using comparative local-vibrational-mode and deep-level transient spectroscopy, we have studied the off-center O sub As defect in high-resistivity, undoped GaAs and neutron-transmutation-doped, n-type samples from the same starting material. The results fully support that this defect has a negative-U character. They also reveal that its deeper, two-electron level corresponds to the chemically unidentified EL 3 defect level in GaAs at E sub c -0.58 eV
Conventional deep level transient spectroscopy (DLTS) and high-resolution Laplace DLTS techniques we...
We observe a very strong anisotropy of the internal field effect for defect « EL2 » (a well-known de...
Three dominant electron traps S1 (Ec - 0.23 eV), S2* (Ec - 0.53 eV), and S4 (Ec - 0.74 eV) are intro...
Thermally stimulated current (TSC) and photo induced current transient spectroscopy (PICTS) were us...
The (O/plus) donor level of the SbsubGa heteroantisite and the off-center OsubAs-induced EL3 level i...
We have studied the Ec - 0.4 e V center in O-doped GaAs by a combination of temperature-dependent Ha...
Capacitance-voltage characterization at different temperatures and emission and capture deep-level t...
Spectroscopic and transport measurements on a variety of semi-insulating and n-type GaAs single crys...
Defects created in rapid thermally annealed (RTA) SiO2-capped epitaxial GaAs layers grown by metal-o...
Symposium Theme: Defect and impurity engineered semiconductors IIBased on the charge redistribution ...
We have used deep level transient spectroscopy to study the electric-field-enhanced electron emissio...
Optical transient current spectroscopy (OTCS) has been used to investigate defects in the low-temper...
The electrical resistivity and deep level transient spectroscopy measurements of n-type GaAs under u...
Temperature-dependent Hall-effect measurements have been performed on pure, n-type, vapor-phase epit...
We have studied oxygen point defects with the plane-wave pseudopotential method in GaAs, GaN, and Al...
Conventional deep level transient spectroscopy (DLTS) and high-resolution Laplace DLTS techniques we...
We observe a very strong anisotropy of the internal field effect for defect « EL2 » (a well-known de...
Three dominant electron traps S1 (Ec - 0.23 eV), S2* (Ec - 0.53 eV), and S4 (Ec - 0.74 eV) are intro...
Thermally stimulated current (TSC) and photo induced current transient spectroscopy (PICTS) were us...
The (O/plus) donor level of the SbsubGa heteroantisite and the off-center OsubAs-induced EL3 level i...
We have studied the Ec - 0.4 e V center in O-doped GaAs by a combination of temperature-dependent Ha...
Capacitance-voltage characterization at different temperatures and emission and capture deep-level t...
Spectroscopic and transport measurements on a variety of semi-insulating and n-type GaAs single crys...
Defects created in rapid thermally annealed (RTA) SiO2-capped epitaxial GaAs layers grown by metal-o...
Symposium Theme: Defect and impurity engineered semiconductors IIBased on the charge redistribution ...
We have used deep level transient spectroscopy to study the electric-field-enhanced electron emissio...
Optical transient current spectroscopy (OTCS) has been used to investigate defects in the low-temper...
The electrical resistivity and deep level transient spectroscopy measurements of n-type GaAs under u...
Temperature-dependent Hall-effect measurements have been performed on pure, n-type, vapor-phase epit...
We have studied oxygen point defects with the plane-wave pseudopotential method in GaAs, GaN, and Al...
Conventional deep level transient spectroscopy (DLTS) and high-resolution Laplace DLTS techniques we...
We observe a very strong anisotropy of the internal field effect for defect « EL2 » (a well-known de...
Three dominant electron traps S1 (Ec - 0.23 eV), S2* (Ec - 0.53 eV), and S4 (Ec - 0.74 eV) are intro...