Add to ORKGA theoretical formalism and experimental methods are presented, which enable statistical fluctuations of the film bulk and interface roughness properties to be estimated from volume scattering and roughness scattering, respectively. The theoretical model is implemented in a numerical algorithm that allows to optimize experimental strategies and to determine morphological parameters from measured scattering curves. Angle resolved scattering (ARS) measurements are performed on MgF2 films on glass substrates while varying the illumination and observation parameters. Atomic force microscopy (AFM) provides helpful additional information on the surface morphology
Optical scattering arising from interface roughness and interference effects is a dominant loss mech...
For a variety of UV optical coatings, surface roughness was measured by use of an atomic-force-micro...
The roughness of a number of uncoated glass substrates with different surface qualities and of surfa...
We investigated thin MgF2/LaF3- and LaF3/MgF2-layers on opaque glass with angle resolved light scatt...
An attempt is presented of a systematic experimental approach to the problem of scattering and rough...
For the roughness characterization of optical surfaces a new procedure based on the analysis of thei...
A theoretical model is presented that describes the volume scattering in thin optical films, particu...
The work presents an application of two scanning optical techniques, i.e. optical profilometry and a...
Substrate properties, coating design, and deposition process determine the surface morphology of opt...
The surface roughness of polished glass substrates as well as metal an dielectric coatings is studie...
From atomic force microscopy (AFM) topographic data, the power spectral densities (PSDs) of substrat...
A variety of technical applications require surface roughnesses to be measured and characterized ove...
This paper focuses on scattering phenomena resulting from isotropic microroughness as well as from c...
Combination of atomic force microscopy and scattering measurements allows controlling the microstruc...
Light scattered from interface imperfections carries valuable information about its origins. For sin...
Optical scattering arising from interface roughness and interference effects is a dominant loss mech...
For a variety of UV optical coatings, surface roughness was measured by use of an atomic-force-micro...
The roughness of a number of uncoated glass substrates with different surface qualities and of surfa...
We investigated thin MgF2/LaF3- and LaF3/MgF2-layers on opaque glass with angle resolved light scatt...
An attempt is presented of a systematic experimental approach to the problem of scattering and rough...
For the roughness characterization of optical surfaces a new procedure based on the analysis of thei...
A theoretical model is presented that describes the volume scattering in thin optical films, particu...
The work presents an application of two scanning optical techniques, i.e. optical profilometry and a...
Substrate properties, coating design, and deposition process determine the surface morphology of opt...
The surface roughness of polished glass substrates as well as metal an dielectric coatings is studie...
From atomic force microscopy (AFM) topographic data, the power spectral densities (PSDs) of substrat...
A variety of technical applications require surface roughnesses to be measured and characterized ove...
This paper focuses on scattering phenomena resulting from isotropic microroughness as well as from c...
Combination of atomic force microscopy and scattering measurements allows controlling the microstruc...
Light scattered from interface imperfections carries valuable information about its origins. For sin...
Optical scattering arising from interface roughness and interference effects is a dominant loss mech...
For a variety of UV optical coatings, surface roughness was measured by use of an atomic-force-micro...
The roughness of a number of uncoated glass substrates with different surface qualities and of surfa...