Add to ORKGWe present a new type of near-field Acoustic Microscopy combining Atomic Force Microscopy (AFM) and Acoustic Microscopy. The lateral resolution is given by the probe diameter instead of the acoustic wavelength and can reach atomic scale on flat samples. The ultrasonic vibrations of the AFM cantilever are examined as well as the nonlinear interaction between the AFM tip and the sample surface. An ultrasonic image taken with the new technique is shown
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfac...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified at...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
The development of acoustic subsurface atomic force microscopy, which promises three-dimensional ima...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Acoustic microscopy not only allows imaging of sample surfaces with high spatial resolution but also...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfac...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified at...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
The development of acoustic subsurface atomic force microscopy, which promises three-dimensional ima...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Acoustic microscopy not only allows imaging of sample surfaces with high spatial resolution but also...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfac...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...